Laurens Franz Taemsz Kwakman

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Saint Ismier, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for wafer defect inspection
- Patent number 11,513,079
- Issue date Nov 29, 2022
- FEI Company
- Roger Alvis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High aspect ratio X-ray targets and uses of same
- Patent number 10,366,860
- Issue date Jul 30, 2019
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
Tomography sample preparation systems and methods with improved spe...
- Patent number 10,190,953
- Issue date Jan 29, 2019
- Guillaume Delpy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High aspect ratio x-ray targets and uses of same
- Patent number 9,934,930
- Issue date Apr 3, 2018
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of measuring the temperature of a sample carrier in a charge...
- Patent number 8,757,873
- Issue date Jun 24, 2014
- FEI Company
- Stephanus Hubertus Leonardus van den Boom
- G01 - MEASURING TESTING
Information Patent Grant
Method of X-ray analysis in a particle-optical apparatus
- Patent number 6,646,263
- Issue date Nov 11, 2003
- FEI Company
- Laurens Franz Taemsz Kwakman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR WAFER DEFECT INSPECTION
- Publication number 20220113262
- Publication date Apr 14, 2022
- FEI Company
- Roger Alvis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME
- Publication number 20180190467
- Publication date Jul 5, 2018
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
TOMOGRAPHY SAMPLE PREPARATION SYSTEMS AND METHODS WITH IMPROVED SPE...
- Publication number 20180143110
- Publication date May 24, 2018
- FEI Company
- Guillaume Delpy
- G01 - MEASURING TESTING
Information Patent Application
HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME
- Publication number 20150303021
- Publication date Oct 22, 2015
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
Method of X-ray analysis in a particle-optical apparatus
- Publication number 20020154731
- Publication date Oct 24, 2002
- Laurens Franz Taemsz Kwakman
- G01 - MEASURING TESTING