Laurent G. Gosset

Person

Grenoble, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Integration of self-aligned trenches in-between metal lines
- Patent number 8,470,685
- Issue date Jun 25, 2013
- STMicroelectronics (Crolles 2) SAS
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MIM capacitor with enhanced capacitance
- Patent number 8,424,177
- Issue date Apr 23, 2013
- STMicroelectronics (Crolles 2) SAS
- Alexis Farcy
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Control of carbon nanostructure growth in an interconnect structure
- Patent number 8,399,772
- Issue date Mar 19, 2013
- NXP B.V.
- Laurent Gosset
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fabrication of a diffusion barrier cap on copper containing conduct...
- Patent number 8,143,157
- Issue date Mar 27, 2012
- NXP B.V.
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming metal interconnects in a dielectric material
- Patent number 8,138,082
- Issue date Mar 20, 2012
- STMicroelectronics (Crolles 2) SAS
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling lateral distribution of air gaps in interconnects
- Patent number 8,110,879
- Issue date Feb 7, 2012
- STMicroelectronics (Crolles 2) SAS
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control of localized air gap formation in an interconnect stack
- Patent number 8,097,949
- Issue date Jan 17, 2012
- NXP B.V.
- Laurent Gosset
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of a reliable diffusion-barrier cap on a Cu-containing in...
- Patent number 7,989,342
- Issue date Aug 2, 2011
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling lateral distribution of air gaps in interconnects
- Patent number 7,605,071
- Issue date Oct 20, 2009
- STMicroelectronics (Crolles 2) SAS
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integration control and reliability enhancement of interconnect air...
- Patent number 7,553,739
- Issue date Jun 30, 2009
- STMicroelectronics (Corlles 2) SAS
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabricating an integrated electronic circuit that incor...
- Patent number 7,172,980
- Issue date Feb 6, 2007
- STMicroelectronics S.A.
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MIM CAPACITOR
- Publication number 20130286540
- Publication date Oct 31, 2013
- Alexis Farcy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIM CAPACITOR
- Publication number 20110080686
- Publication date Apr 7, 2011
- STMicroelectronics (Crolles 2) SAS
- Alexis Farcy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION OF A RELIABLE DIFFUSION-BARRIER CAP ON A CU-CONTAINING IN...
- Publication number 20100120243
- Publication date May 13, 2010
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATION OF SELF-ALIGNED TRENCHES IN-BETWEEN METAL LINES
- Publication number 20100090346
- Publication date Apr 15, 2010
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADHESION OF DIFFUSION BARRIER ON COPPER-CONTAINING INTERCONNECT ELE...
- Publication number 20100059889
- Publication date Mar 11, 2010
- NXP, B.V.
- Laurent Georges Gosset
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION OF A DIFFUSION BARRIER CAP ON COPPER CONTAINING CONDUCT...
- Publication number 20100044865
- Publication date Feb 25, 2010
- NXP B.V.
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROLLING LATERAL DISTRIBUTION OF AIR GAPS IN INTERCONNECTS
- Publication number 20100038797
- Publication date Feb 18, 2010
- STMicroelectronics S.A.
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR FABRICATING AN INTEGRATED ELECTRONIC CIRCUIT INCORPORAT...
- Publication number 20090321946
- Publication date Dec 31, 2009
- NXP, B.V.
- Laurent G. Gosset
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL OF CARBON NANOSTRUCTURE GROWTH IN AN INTERCONNECT STRUCTURE
- Publication number 20090272565
- Publication date Nov 5, 2009
- Laurent Gosset
- B82 - NANO-TECHNOLOGY
Information Patent Application
CONTROL OF LOCALIZED AIR GAP FORMATION IN AN INTERCONNECT STACK
- Publication number 20090243108
- Publication date Oct 1, 2009
- Laurent Gosset
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL INTERCONNECTS IN A DIELECTRIC MATERIAL
- Publication number 20090218699
- Publication date Sep 3, 2009
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATION CONTROL AND RELIABILITY ENHANCEMENT OF INTERCONNECT AIR...
- Publication number 20070054485
- Publication date Mar 8, 2007
- STMicroelectronics (Crolles 2) SAS
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Controlling lateral distribution of air gaps in interconnects
- Publication number 20070037380
- Publication date Feb 15, 2007
- STMicroelectronics (Crolles 2) SAS
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for fabricating an integrated electronic circuit that incor...
- Publication number 20040229454
- Publication date Nov 18, 2004
- STMicroelectronics S.A.
- Joaquin Torres
- H01 - BASIC ELECTRIC ELEMENTS

Laurent G. Gosset

Person

Patents Grantslast 30 patents

Integration of self-aligned trenches in-between metal lines

MIM capacitor with enhanced capacitance

Control of carbon nanostructure growth in an interconnect structure

Fabrication of a diffusion barrier cap on copper containing conduct...

Method for forming metal interconnects in a dielectric material

Controlling lateral distribution of air gaps in interconnects

Control of localized air gap formation in an interconnect stack

Formation of a reliable diffusion-barrier cap on a Cu-containing in...

Controlling lateral distribution of air gaps in interconnects

Integration control and reliability enhancement of interconnect air...

Process for fabricating an integrated electronic circuit that incor...

Patents Applicationslast 30 patents

MIM CAPACITOR

MIM CAPACITOR

FORMATION OF A RELIABLE DIFFUSION-BARRIER CAP ON A CU-CONTAINING IN...

INTEGRATION OF SELF-ALIGNED TRENCHES IN-BETWEEN METAL LINES

ADHESION OF DIFFUSION BARRIER ON COPPER-CONTAINING INTERCONNECT ELE...

FABRICATION OF A DIFFUSION BARRIER CAP ON COPPER CONTAINING CONDUCT...

CONTROLLING LATERAL DISTRIBUTION OF AIR GAPS IN INTERCONNECTS

PROCESS FOR FABRICATING AN INTEGRATED ELECTRONIC CIRCUIT INCORPORAT...

CONTROL OF CARBON NANOSTRUCTURE GROWTH IN AN INTERCONNECT STRUCTURE

CONTROL OF LOCALIZED AIR GAP FORMATION IN AN INTERCONNECT STACK

METAL INTERCONNECTS IN A DIELECTRIC MATERIAL

INTEGRATION CONTROL AND RELIABILITY ENHANCEMENT OF INTERCONNECT AIR...

Controlling lateral distribution of air gaps in interconnects

Process for fabricating an integrated electronic circuit that incor...