Laurent Karsenti

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Context-based defect inspection
- Patent number 11,922,619
- Issue date Mar 5, 2024
- KLA Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerated training of a machine learning based model for semicond...
- Patent number 11,580,375
- Issue date Feb 14, 2023
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Training a neural network for defect detection in low resolution im...
- Patent number 10,599,951
- Issue date Mar 24, 2020
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for region-adaptive defect detection
- Patent number 10,535,131
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Christopher Maher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Virtual inspection systems for process window characterization
- Patent number 10,402,461
- Issue date Sep 3, 2019
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Contour based defect detection
- Patent number 10,395,362
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Ajay Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Accelerating semiconductor-related computations using learning base...
- Patent number 10,360,477
- Issue date Jul 23, 2019
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single image detection
- Patent number 10,186,026
- Issue date Jan 22, 2019
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating simulated output for a specimen
- Patent number 10,043,261
- Issue date Aug 7, 2018
- KLA-Tencor Corp.
- Kris Bhaskar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Detecting defects on a wafer with run time use of design data
- Patent number 9,183,624
- Issue date Nov 10, 2015
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for defect detection and process monitoring based on SEM images
- Patent number 7,764,824
- Issue date Jul 27, 2010
- Applied Materials Israel, Ltd.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CONTEXT-BASED DEFECT INSPECTION
- Publication number 20230316500
- Publication date Oct 5, 2023
- KLA Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING A NEURAL NETWORK FOR DEFECT DETECTION IN LOW RESOLUTION IM...
- Publication number 20190303717
- Publication date Oct 3, 2019
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTOUR BASED DEFECT DETECTION
- Publication number 20180293721
- Publication date Oct 11, 2018
- KLA-Tencor Corporation
- Ajay Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATING SEMICONDUCTOR-RELATED COMPUTATIONS USING LEARNING BASE...
- Publication number 20170200260
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING SIMULATED OUTPUT FOR A SPECIMEN
- Publication number 20170200265
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...
- Publication number 20170193400
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Region-Adaptive Defect Detection
- Publication number 20170140516
- Publication date May 18, 2017
- KLA-Tencor Corporation
- Christopher Maher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE IMAGE DETECTION
- Publication number 20170140524
- Publication date May 18, 2017
- KLA-Tencor Corporation
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Virtual Inspection Systems for Process Window Characterization
- Publication number 20160150191
- Publication date May 26, 2016
- KLA-Tencor Corporation
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detecting Defects on a Wafer with Run Time Use of Design Data
- Publication number 20140376801
- Publication date Dec 25, 2014
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for defect detection and process monitoring based on sem images
- Publication number 20060251340
- Publication date Nov 9, 2006
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING

Laurent Karsenti

Person

Patents Grantslast 30 patents

Context-based defect inspection

Accelerated training of a machine learning based model for semicond...

Training a neural network for defect detection in low resolution im...

Systems and methods for region-adaptive defect detection

Virtual inspection systems for process window characterization

Contour based defect detection

Accelerating semiconductor-related computations using learning base...

Single image detection

Generating simulated output for a specimen

Detecting defects on a wafer with run time use of design data

Method for defect detection and process monitoring based on SEM images

Patents Applicationslast 30 patents

CONTEXT-BASED DEFECT INSPECTION

TRAINING A NEURAL NETWORK FOR DEFECT DETECTION IN LOW RESOLUTION IM...

CONTOUR BASED DEFECT DETECTION

ACCELERATING SEMICONDUCTOR-RELATED COMPUTATIONS USING LEARNING BASE...

GENERATING SIMULATED OUTPUT FOR A SPECIMEN

ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...

Systems and Methods for Region-Adaptive Defect Detection

SINGLE IMAGE DETECTION

Virtual Inspection Systems for Process Window Characterization

Detecting Defects on a Wafer with Run Time Use of Design Data

Method for defect detection and process monitoring based on sem images