Laurent Roussel

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method for obtaining images from slices of specimen
- Patent number 8,431,896
- Issue date Apr 30, 2013
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING
Information Patent Grant
Method for obtaining images from slices of specimen
- Patent number 7,977,631
- Issue date Jul 12, 2011
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OBTAINING IMAGES FROM SLICES OF SPECIMEN
- Publication number 20110226819
- Publication date Sep 22, 2011
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING
Information Patent Application
Method for obtaining images from slices of specimen
- Publication number 20080088831
- Publication date Apr 17, 2008
- FEI Company
- Johannes Jacobus Lambertus Mulders
- G01 - MEASURING TESTING