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Lawrence A. Kropp
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Pleasant Valley, NY, US
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last 30 patents
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Patent Grant
Precise endpoint detection for etching processes
Patent number
6,258,497
Issue date
Jul 10, 2001
International Business Machines Corporation
Lawrence Andrew Kropp
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Reaction chamber interelectrode gap monitoring by capacitance measu...
Patent number
5,382,911
Issue date
Jan 17, 1995
International Business Machines Corporation
Tina J. Cotler
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...