Lawrence B. Luce

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Sun Lakes, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
High throughput semiconductor device testing
- Patent number 8,527,231
- Issue date Sep 3, 2013
- Teradyne, Inc.
- Lawrence B. Luce
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH THROUGHPUT SEMICONDUCTOR DEVICE TESTING
- Publication number 20120065906
- Publication date Mar 15, 2012
- LAWRENCE B. LUCE
- G01 - MEASURING TESTING
Information Patent Application
SELF-TEST STRUCTURE AND METHOD OF TESTING A DIGITAL INTERFACE
- Publication number 20080195920
- Publication date Aug 14, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Lawrence B. Luce
- G01 - MEASURING TESTING