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Lawrence C. Widdoes Jr.
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Los Altos Hills, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Metastability effects simulation for a circuit description
Patent number
8,914,761
Issue date
Dec 16, 2014
Mentor Graphics Corporation
Tai An Ly
G01 - MEASURING TESTING
Information
Patent Grant
Metastability effects simulation for a circuit description
Patent number
8,438,516
Issue date
May 7, 2013
Mentor Graphics Corporation
Tai An Ly
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatically generating checkers for finding functional...
Patent number
6,609,229
Issue date
Aug 19, 2003
O-In Design Automation, Inc.
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for automatically searching for functional defects in a desc...
Patent number
6,292,765
Issue date
Sep 18, 2001
O-IN Design Automation
Chian-Min Richard Ho
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatically generating checkers for finding functional...
Patent number
6,175,946
Issue date
Jan 16, 2001
O-IN Design Automation
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for and method of connecting a hardware modeling element to...
Patent number
6,148,275
Issue date
Nov 14, 2000
Synopsys, Inc.
Mark Stanley Papamarcos
G01 - MEASURING TESTING
Information
Patent Grant
Hardware modeling system and method of use
Patent number
5,625,580
Issue date
Apr 29, 1997
Synopsys, Inc.
Andrew J. Read
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for and method of connecting a hardware modeling element to...
Patent number
5,369,593
Issue date
Nov 29, 1994
Synopsys Inc.
Mark S. Papamarcos
G01 - MEASURING TESTING
Information
Patent Grant
Hardware modeling system and method of use
Patent number
5,353,243
Issue date
Oct 4, 1994
Synopsys Inc.
Andrew J. Read
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METASTABILITY EFFECTS SIMULATION FOR A CIRCUIT DESCRIPTION
Publication number
20130246985
Publication date
Sep 19, 2013
Mentor Graphics Corporation
Tai An Ly
G01 - MEASURING TESTING
Information
Patent Application
METASTABILITY EFFECTS SIMULATION FOR A CIRCUIT DESCRIPTION
Publication number
20080134115
Publication date
Jun 5, 2008
Mentor Graphics Corporation
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Reuse of learned information to simplify functional verification of...
Publication number
20070299648
Publication date
Dec 27, 2007
Jeremy R. Levitt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METASTABILITY INJECTOR FOR A CIRCUIT DESCRIPTION
Publication number
20070230645
Publication date
Oct 4, 2007
Mentor Graphics Corporation
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Metastability effects simulation for a circuit description
Publication number
20050268265
Publication date
Dec 1, 2005
Mentor Graphics Corporation
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for automatically searching for functional defects in a desc...
Publication number
20050131665
Publication date
Jun 16, 2005
Chian-Min Richard Ho
G01 - MEASURING TESTING
Information
Patent Application
Method for automatically generating checkers for finding functional...
Publication number
20030200515
Publication date
Oct 23, 2003
0-In Design automation Inc.
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING