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Lawrence D. Thorp
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Yorktown, NY, US
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last 30 patents
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Patent Grant
Method and apparatus for object inspection
Patent number
5,220,617
Issue date
Jun 15, 1993
International Business Machines Corporation
Kenneth A. Bird
G01 - MEASURING TESTING
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Patent Grant
Advanced via inspection tool (AVIT)
Patent number
5,216,485
Issue date
Jun 1, 1993
International Business Machines Corporation
Kenneth A. Bird
G01 - MEASURING TESTING
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Patent Grant
Wide band grating spectrometer
Patent number
4,060,327
Issue date
Nov 29, 1977
International Business Machines Corporation
Lawrence Jacobowitz
G01 - MEASURING TESTING