Lawrence Hendler

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated model building and model updating
- Patent number 8,271,103
- Issue date Sep 18, 2012
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Grant
Process control using process data and yield data
- Patent number 7,996,102
- Issue date Aug 9, 2011
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Grant
Self-correcting multivariate analysis for use in monitoring dynamic...
- Patent number 7,809,450
- Issue date Oct 5, 2010
- MKS Instruments, Inc.
- Uzi Josef Lev-Ami
- G05 - CONTROLLING REGULATING
Information Patent Grant
Manufacturing process end point detection
- Patent number 7,630,786
- Issue date Dec 8, 2009
- MKS Instruments, Inc.
- Lawrence Hendler
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Process control using process data and yield data
- Patent number 7,622,308
- Issue date Nov 24, 2009
- MKS Instruments, Inc.
- Lawrence Hendler
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for classifying manufacturing outputs
- Patent number 7,313,454
- Issue date Dec 25, 2007
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Grant
High-speed, high-resolution, large area inspection using multiple o...
- Patent number 5,966,212
- Issue date Oct 12, 1999
- Pixel Systems, Inc.
- Lawrence Hendler
- G01 - MEASURING TESTING
Information Patent Grant
Prober and tester with contact interface for integrated circuits-co...
- Patent number 5,656,942
- Issue date Aug 12, 1997
- Electroglas, Inc.
- Michael P. C. Watts
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection using fourier optics and a spatial separator for s...
- Patent number 5,506,676
- Issue date Apr 9, 1996
- Pixel Systems, Inc.
- Lawrence Hendler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED MODEL BUILDING AND MODEL UPDATING
- Publication number 20120303142
- Publication date Nov 29, 2012
- MKS Instruments Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
PROCESS CONTROL USING PROCESS DATA AND YIELD DATA
- Publication number 20100100223
- Publication date Apr 22, 2010
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
Process Control Using Process Data and Yield Data
- Publication number 20090228247
- Publication date Sep 10, 2009
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
Automated Model Building and Model Updating
- Publication number 20090037013
- Publication date Feb 5, 2009
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
Manufacturing Process End Point Detection
- Publication number 20080221720
- Publication date Sep 11, 2008
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
Classifying faults associated with a manufacturing process
- Publication number 20080010531
- Publication date Jan 10, 2008
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for classifying manufacturing outputs
- Publication number 20070129836
- Publication date Jun 7, 2007
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
Self-correcting multivariate analysis for use in monitoring dynamic...
- Publication number 20070021859
- Publication date Jan 25, 2007
- MKS Instruments, Inc.
- Uzi Josef Lev-Ami
- G05 - CONTROLLING REGULATING

Lawrence Hendler

Person

Patents Grantslast 30 patents

Automated model building and model updating

Process control using process data and yield data

Self-correcting multivariate analysis for use in monitoring dynamic...

Manufacturing process end point detection

Process control using process data and yield data

Method and apparatus for classifying manufacturing outputs

High-speed, high-resolution, large area inspection using multiple o...

Prober and tester with contact interface for integrated circuits-co...

Defect detection using fourier optics and a spatial separator for s...

Patents Applicationslast 30 patents

AUTOMATED MODEL BUILDING AND MODEL UPDATING

PROCESS CONTROL USING PROCESS DATA AND YIELD DATA

Process Control Using Process Data and Yield Data

Automated Model Building and Model Updating

Manufacturing Process End Point Detection

Classifying faults associated with a manufacturing process

Method and apparatus for classifying manufacturing outputs

Self-correcting multivariate analysis for use in monitoring dynamic...