Lawrence Lane

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,474,993
- Issue date Jan 6, 2009
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Selecting a hypothetical profile to use in optical metrology
- Patent number 7,394,554
- Issue date Jul 1, 2008
- Timbre Technologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology model optimization for process control
- Patent number 7,395,132
- Issue date Jul 1, 2008
- Timbre Technologies, Inc.
- Daniel Prager
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology model optimization for process control
- Patent number 7,221,989
- Issue date May 22, 2007
- Tokyo Electron Limited
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,216,045
- Issue date May 8, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology model optimization for process control
- Patent number 7,065,423
- Issue date Jun 20, 2006
- Timbre Technologies, Inc.
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of metal electroplating and seed layer thickness and pr...
- Patent number 6,608,686
- Issue date Aug 19, 2003
- Timbre Technologies, Inc.
- Lawrence Lane
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical metrology model optimization for process control
- Publication number 20070225851
- Publication date Sep 27, 2007
- Timbre Technologies, Inc.
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20070198211
- Publication date Aug 23, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Application
Optical metrology model optimization for process control
- Publication number 20060247816
- Publication date Nov 2, 2006
- TOKYO ELECTRON LIMITED
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Application
Optical metrology model optimization for process control
- Publication number 20060009872
- Publication date Jan 12, 2006
- Timbre Technologies, Inc.
- Dan Prager
- G01 - MEASURING TESTING
Information Patent Application
Selecting a hypothetical profile to use in optical metrology
- Publication number 20050057748
- Publication date Mar 17, 2005
- TimbreTechnologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20030225535
- Publication date Dec 4, 2003
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF METAL ELECTROPLATING AND SEED LAYER THICKNESS AND PR...
- Publication number 20030151751
- Publication date Aug 14, 2003
- Lawrence Lane
- G01 - MEASURING TESTING

Lawrence Lane

Person

Patents Grantslast 30 patents

Selection of wavelengths for integrated circuit optical metrology

Selecting a hypothetical profile to use in optical metrology

Optical metrology model optimization for process control

Optical metrology model optimization for process control

Selection of wavelengths for integrated circuit optical metrology

Optical metrology model optimization for process control

Measurement of metal electroplating and seed layer thickness and pr...

Patents Applicationslast 30 patents

Optical metrology model optimization for process control

Selection of wavelengths for integrated circuit optical metrology

Optical metrology model optimization for process control

Optical metrology model optimization for process control

Selecting a hypothetical profile to use in optical metrology

Selection of wavelengths for integrated circuit optical metrology

MEASUREMENT OF METAL ELECTROPLATING AND SEED LAYER THICKNESS AND PR...