Lawrence S. Fischer

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor copper line cutting method
- Patent number 6,987,067
- Issue date Jan 17, 2006
- International Business Machines Corporation
- Lawrence Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample mount for performing sputter-deposition in a focused ion bea...
- Patent number 6,946,064
- Issue date Sep 20, 2005
- International Business Machines Corporation
- Lawrence S. Fischer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for electrically characterizing charge sensitive semiconduct...
- Patent number 6,858,530
- Issue date Feb 22, 2005
- International Business Machines Corporation
- Terence Kane
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method for charge sensitive electrical devices
- Patent number 6,670,717
- Issue date Dec 30, 2003
- International Business Machines Corporation
- Terence Kane
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MANIPULATING SAMPLE TEMPERATURE FOR FOCUSE...
- Publication number 20060065853
- Publication date Mar 30, 2006
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE MOUNT FOR PERFORMING SPUTTER-DEPOSITION IN A FOCUSED ION BEA...
- Publication number 20050006231
- Publication date Jan 13, 2005
- International Business Machines Corporation
- Lawrence S. Fischer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Dry etch process for copper
- Publication number 20040132287
- Publication date Jul 8, 2004
- International Business Machines Corporation
- Lawrence S. Fischer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Structure and method for charge sensitive electrical devices
- Publication number 20040089952
- Publication date May 13, 2004
- Terence Kane
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor copper line cutting method
- Publication number 20040038433
- Publication date Feb 26, 2004
- International Business Machines Corporation
- Lawrence Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and method for charge sensitive electrical devices
- Publication number 20030071361
- Publication date Apr 17, 2003
- International Business Machines Corporation
- Terence Kane
- G01 - MEASURING TESTING

Lawrence S. Fischer

Person

Patents Grantslast 30 patents

Semiconductor copper line cutting method

Sample mount for performing sputter-deposition in a focused ion bea...

Method for electrically characterizing charge sensitive semiconduct...

Structure and method for charge sensitive electrical devices

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR MANIPULATING SAMPLE TEMPERATURE FOR FOCUSE...

SAMPLE MOUNT FOR PERFORMING SPUTTER-DEPOSITION IN A FOCUSED ION BEA...

Dry etch process for copper

Structure and method for charge sensitive electrical devices

Semiconductor copper line cutting method

Structure and method for charge sensitive electrical devices