Lawrence S. Melvin, III

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining an optical threshold and a res...
- Patent number 8,184,897
- Issue date May 22, 2012
- Synopsys, Inc.
- Jianliang Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining a photolithography process mod...
- Patent number 8,181,128
- Issue date May 15, 2012
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Compact abbe's kernel generation using principal component analysis
- Patent number 8,136,054
- Issue date Mar 13, 2012
- Synopsys, Inc.
- Charlie Chung-ping Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for using a synchrotron as a source in extreme...
- Patent number 7,973,909
- Issue date Jul 5, 2011
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for modeling long-range EUVL flare
- Patent number 7,966,582
- Issue date Jun 21, 2011
- Synopsys, Inc.
- Lawrence S. Melvin, III
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for correlating physical model representation to...
- Patent number 7,933,471
- Issue date Apr 26, 2011
- Synopsys, Inc.
- Jianliang Li
- G02 - OPTICS
Information Patent Grant
Method and apparatus for determining a process model that models th...
- Patent number 7,934,176
- Issue date Apr 26, 2011
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for using a database to quickly identify and c...
- Patent number 7,934,174
- Issue date Apr 26, 2011
- Synopsys, Inc.
- Zong Wu Tang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Modeling mask corner rounding effects using multiple mask layers
- Patent number 7,853,919
- Issue date Dec 14, 2010
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining an optical model that models t...
- Patent number 7,788,630
- Issue date Aug 31, 2010
- Synopsys, Inc.
- Jianliang Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for identifying a manufacturing problem area i...
- Patent number 7,784,018
- Issue date Aug 24, 2010
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining a process model that models th...
- Patent number 7,743,357
- Issue date Jun 22, 2010
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining a process model using a 2-D-pa...
- Patent number 7,739,645
- Issue date Jun 15, 2010
- Synopsys, Inc.
- Jianliang Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus to determine if a pattern is robustly manufact...
- Patent number 7,739,651
- Issue date Jun 15, 2010
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining whether a sub-resolution assis...
- Patent number 7,727,687
- Issue date Jun 1, 2010
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for quickly determining the effect of placing...
- Patent number 7,721,246
- Issue date May 18, 2010
- Synopsys, Inc.
- Jianliang Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Facilitating process model accuracy by modeling mask corner roundin...
- Patent number 7,707,539
- Issue date Apr 27, 2010
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for using a database to quickly identify and c...
- Patent number 7,584,450
- Issue date Sep 1, 2009
- Synopsys, Inc.
- Zong Wu Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for placing assist features by identifying loc...
- Patent number 7,509,621
- Issue date Mar 24, 2009
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for modifying a layout to improve manufacturin...
- Patent number 7,509,624
- Issue date Mar 24, 2009
- Synopsys, Inc.
- Lawrence S. Melvin, III
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for assessing the quality of a process model
- Patent number 7,496,880
- Issue date Feb 24, 2009
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for improving depth of focus during optical li...
- Patent number 7,494,751
- Issue date Feb 24, 2009
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Compensating for effects of topography variation by using a variabl...
- Patent number 7,491,479
- Issue date Feb 17, 2009
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining an improved assist feature con...
- Patent number 7,475,382
- Issue date Jan 6, 2009
- Synopsys, Inc.
- Lawrence S. Melvin, III
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for determining an accurate photolithography p...
- Patent number 7,454,739
- Issue date Nov 18, 2008
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for generating an OPC segmentation based on mo...
- Patent number 7,451,068
- Issue date Nov 11, 2008
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Assist feature placement using a process-sensitivity model
- Patent number 7,421,678
- Issue date Sep 2, 2008
- Synopsys, Inc.
- Levi D. Barnes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for identifying a problem edge in a mask layou...
- Patent number 7,320,119
- Issue date Jan 15, 2008
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for identifying assist feature placement problems
- Patent number 7,315,999
- Issue date Jan 1, 2008
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for correcting 3D mask effects
- Patent number 7,308,673
- Issue date Dec 11, 2007
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Fast Photolithography Process Simulation to Predict Remaining Resis...
- Publication number 20110224963
- Publication date Sep 15, 2011
- Synopsys, Inc.
- Artak Isoyan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A PROCESS MODEL THAT MODELS TH...
- Publication number 20100218160
- Publication date Aug 26, 2010
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPACT ABBE'S KERNEL GENERATION USING PRINCIPAL COMPONENT ANALYSIS
- Publication number 20100191518
- Publication date Jul 29, 2010
- Synopsys, Inc.
- Charlie Chung-ping Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MODELING MASK CORNER ROUNDING EFFECTS USING MULTIPLE MASK LAYERS
- Publication number 20100146476
- Publication date Jun 10, 2010
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR USING A SYNCHROTRON AS A SOURCE IN EXTREME...
- Publication number 20100092880
- Publication date Apr 15, 2010
- Synopsys, Inc.
- Lawrence S. Melvin, III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A PHOTOLITHOGRAPHY PROCESS MOD...
- Publication number 20100095264
- Publication date Apr 15, 2010
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING AN OPTICAL THRESHOLD AND A RES...
- Publication number 20100086196
- Publication date Apr 8, 2010
- Synopsys, Inc.
- Jianliang Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR MODELING LONG RANGE EUVL FLARE
- Publication number 20090292508
- Publication date Nov 26, 2009
- Synopsys, Inc.
- Lawrence S. Melvin, III
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR USING A DATABASE TO QUICKLY IDENTIFY AND C...
- Publication number 20090288047
- Publication date Nov 19, 2009
- Synopsys, Inc.
- Zong Wu Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FACILITATING PROCESS MODEL ACCURACY BY MODELING MASK CORNER ROUNDI...
- Publication number 20090089736
- Publication date Apr 2, 2009
- Synopsys, Inc.
- Jensheng Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus to determine if a pattern is robustly manufact...
- Publication number 20070162888
- Publication date Jul 12, 2007
- Lawrence S. Melvin III
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Lawrence S. Melvin, III

Person

Patents Grantslast 30 patents

Method and apparatus for determining an optical threshold and a res...

Method and apparatus for determining a photolithography process mod...

Compact abbe's kernel generation using principal component analysis

Method and apparatus for using a synchrotron as a source in extreme...

Method and apparatus for modeling long-range EUVL flare

Method and system for correlating physical model representation to...

Method and apparatus for determining a process model that models th...

Method and apparatus for using a database to quickly identify and c...

Modeling mask corner rounding effects using multiple mask layers

Method and apparatus for determining an optical model that models t...

Method and apparatus for identifying a manufacturing problem area i...

Method and apparatus for determining a process model that models th...

Method and apparatus for determining a process model using a 2-D-pa...

Method and apparatus to determine if a pattern is robustly manufact...

Method and apparatus for determining whether a sub-resolution assis...

Method and apparatus for quickly determining the effect of placing...

Facilitating process model accuracy by modeling mask corner roundin...

Method and apparatus for using a database to quickly identify and c...

Method and apparatus for placing assist features by identifying loc...

Method and apparatus for modifying a layout to improve manufacturin...

Method and apparatus for assessing the quality of a process model

Method and apparatus for improving depth of focus during optical li...

Compensating for effects of topography variation by using a variabl...

Method and apparatus for determining an improved assist feature con...

Method and apparatus for determining an accurate photolithography p...

Method and apparatus for generating an OPC segmentation based on mo...

Assist feature placement using a process-sensitivity model

Method and apparatus for identifying a problem edge in a mask layou...

Method and apparatus for identifying assist feature placement problems

Method and apparatus for correcting 3D mask effects

Patents Applicationslast 30 patents

Fast Photolithography Process Simulation to Predict Remaining Resis...

METHOD AND APPARATUS FOR DETERMINING A PROCESS MODEL THAT MODELS TH...

COMPACT ABBE'S KERNEL GENERATION USING PRINCIPAL COMPONENT ANALYSIS

MODELING MASK CORNER ROUNDING EFFECTS USING MULTIPLE MASK LAYERS

METHOD AND APPARATUS FOR USING A SYNCHROTRON AS A SOURCE IN EXTREME...

METHOD AND APPARATUS FOR DETERMINING A PHOTOLITHOGRAPHY PROCESS MOD...

METHOD AND APPARATUS FOR DETERMINING AN OPTICAL THRESHOLD AND A RES...

METHOD AND APPARATUS FOR MODELING LONG RANGE EUVL FLARE

METHOD AND APPARATUS FOR USING A DATABASE TO QUICKLY IDENTIFY AND C...

FACILITATING PROCESS MODEL ACCURACY BY MODELING MASK CORNER ROUNDI...

Method and apparatus to determine if a pattern is robustly manufact...