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Lawrence Tom
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Testing circuits on substrate
Patent number
7,453,260
Issue date
Nov 18, 2008
Electroglas, Inc.
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Grant
Testing circuits on substrate
Patent number
7,259,548
Issue date
Aug 21, 2007
Electroglas, Inc.
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Grant
Testing circuits on substrates
Patent number
7,180,284
Issue date
Feb 20, 2007
Electroglas, Inc.
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Grant
Testing circuits on substrates
Patent number
7,098,649
Issue date
Aug 29, 2006
Electroglas, Inc.
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Grant
Testing circuits on substrates
Patent number
7,002,337
Issue date
Feb 21, 2006
Electroglas, Inc.
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Grant
Testing circuits on substrates
Patent number
6,861,859
Issue date
Mar 1, 2005
Electroglas, Inc.
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Grant
Testing circuits on substrate
Patent number
6,781,394
Issue date
Aug 24, 2004
Electroglas, Inc.
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Grant
Testing circuits on substrates
Patent number
6,771,060
Issue date
Aug 3, 2004
Electroglas, Inc.
Timothy J. Boyle
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Apparatus for alignment of optical elements in an array
Publication number
20090116013
Publication date
May 7, 2009
Sol Focus, Inc.
Lawrence Tom
G01 - MEASURING TESTING
Information
Patent Application
Socket mounting of component in an optical system
Publication number
20080185040
Publication date
Aug 7, 2008
Sol Focus, Inc.
Lawrence Tom
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Method for alignment of optical elements in an array
Publication number
20080037141
Publication date
Feb 14, 2008
Sol Focus, Inc.
Lawrence Tom
F24 - HEATING RANGES VENTILATING
Information
Patent Application
Testing circuits on substrate
Publication number
20060261833
Publication date
Nov 23, 2006
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Application
Testing circuits on substrates
Publication number
20060119346
Publication date
Jun 8, 2006
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Application
Testing circuits on substrate
Publication number
20050116731
Publication date
Jun 2, 2005
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Application
Testing circuits on substrates
Publication number
20040263153
Publication date
Dec 30, 2004
Timothy J. Boyle
G01 - MEASURING TESTING
Information
Patent Application
Testing circuits on substrates
Publication number
20040232928
Publication date
Nov 25, 2004
Timothy J. Boyle
G01 - MEASURING TESTING