Lawrence Tom

Person

  • Sunnyvale, CA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Testing circuits on substrate

    • Patent number 7,453,260
    • Issue date Nov 18, 2008
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrate

    • Patent number 7,259,548
    • Issue date Aug 21, 2007
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates

    • Patent number 7,180,284
    • Issue date Feb 20, 2007
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates

    • Patent number 7,098,649
    • Issue date Aug 29, 2006
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates

    • Patent number 7,002,337
    • Issue date Feb 21, 2006
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates

    • Patent number 6,861,859
    • Issue date Mar 1, 2005
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrate

    • Patent number 6,781,394
    • Issue date Aug 24, 2004
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates

    • Patent number 6,771,060
    • Issue date Aug 3, 2004
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents