Membership
Tour
Register
Log in
Lawrence V. Bot
Follow
Person
Maple Grove, MN, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
Patent number
11,733,035
Issue date
Aug 22, 2023
NOVA MEASURING INSTRUMENTS INC.
Heath Pois
G01 - MEASURING TESTING
Information
Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
Patent number
11,029,148
Issue date
Jun 8, 2021
NOVA MEASURING INSTRUMENTS, INC.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
Patent number
10,648,802
Issue date
May 12, 2020
NOVA MEASURING INSTRUMENTS, INC.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
Patent number
10,082,390
Issue date
Sep 25, 2018
Nova Measuring Instruments Inc.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for analyzing data generated by instruments
Patent number
7,231,324
Issue date
Jun 12, 2007
ReVera Incorporated
James Orrock
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20240085174
Publication date
Mar 14, 2024
NOVA MEASURING INSTRUMENTS INC.
Heath POIS
G01 - MEASURING TESTING
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20210372787
Publication date
Dec 2, 2021
NOVA MEASURING INSTRUMENTS INC.
Heath POIS
G01 - MEASURING TESTING
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20200370885
Publication date
Nov 26, 2020
Nova Measuring Instruments, Inc.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20190360800
Publication date
Nov 28, 2019
Nova Measuring Instruments, Inc.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20190033069
Publication date
Jan 31, 2019
Nova Measuring Instruments, Inc.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Application
Feed-Forward of Multi-Layer and Multi-Process Information using XPS...
Publication number
20170160081
Publication date
Jun 8, 2017
ReVera, Incorporated
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Application
Techniques for analyzing data generated by instruments
Publication number
20060247899
Publication date
Nov 2, 2006
James Orrock
G01 - MEASURING TESTING