Lay Yeap Lim

Follow

Person

Batu Berendam, MY

People

Patents Grantslast 30 patents

Information Patent Grant
Strip testing of semiconductor devices
- Patent number 9,728,492
- Issue date Aug 8, 2017
- Infineon Technologies AG
- Thiong Zhou See
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric component with an electrophoretically deposited film
- Patent number 9,303,327
- Issue date Apr 5, 2016
- Infineon Technologies AG
- Sung Hoe Yeong
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Lead frame strips with electrical isolation of die paddles
- Patent number 9,263,419
- Issue date Feb 16, 2016
- Infineon Technologies AG
- Nee Wan Khoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extended contact area for leadframe strip testing
- Patent number 9,252,063
- Issue date Feb 2, 2016
- Infineon Technologies AG
- Nee Wan Khoo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
EXTENDED CONTACT AREA FOR LEADFRAME STRIP TESTING
- Publication number 20160005663
- Publication date Jan 7, 2016
- INFINEON TECHNOLOGIES AG
- Nee Wan Khoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lead Frame Strips with Electrical Isolation of Die Paddles
- Publication number 20150064849
- Publication date Mar 5, 2015
- INFINEON TECHNOLOGIES AG
- Nee Wan Khoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Electrophoretic Depositing (EPD) a Film on an Exposed Con...
- Publication number 20140192500
- Publication date Jul 10, 2014
- INFINEON TECHNOLOGIES AG
- Sung Hoe Yeong
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR