Le-Tien Jung

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having thyristor and metal-oxide semiconductor...
- Patent number 10,541,241
- Issue date Jan 21, 2020
- United Microelectronics Corp.
- Yukihiro Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having thyristor and metal-oxide semiconductor...
- Patent number 10,388,656
- Issue date Aug 20, 2019
- United Microelectronics Corp.
- Yukihiro Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of integrating thyristor and metal-oxide semiconductor trans...
- Patent number 10,134,736
- Issue date Nov 20, 2018
- UNITED MICROELECTRONICS CORP.
- Yukihiro Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 9,679,901
- Issue date Jun 13, 2017
- United Microelectronics Corp.
- Ying-Chiao Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing flash memory cell
- Patent number 8,778,760
- Issue date Jul 15, 2014
- Taiwan Memory Company
- Yung-Chang Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried bit line process and scheme
- Patent number 8,748,961
- Issue date Jun 10, 2014
- Taiwan Memory Corporation
- Le-Tien Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing flash memory cell
- Patent number 8,664,062
- Issue date Mar 4, 2014
- Taiwan Memory Company
- Yung-Chang Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method for a buried circuit structure
- Patent number 8,431,485
- Issue date Apr 30, 2013
- Taiwan Memory Company
- Le-Tien Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method for a buried circuit structure
- Patent number 8,183,146
- Issue date May 22, 2012
- Taiwan Memory Company
- Tai-Sheng Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating storage node with supported structure of stac...
- Patent number 7,749,856
- Issue date Jul 6, 2010
- Nanya Technology Corp.
- Shih-Fan Kuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test key structure
- Patent number 7,279,707
- Issue date Oct 9, 2007
- United Microelectronics Corp.
- Chuck Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preventing polycide gate spiking
- Patent number 6,627,525
- Issue date Sep 30, 2003
- United Microelectronics Corp.
- Ming-Tsung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a triple well structure
- Patent number 6,399,465
- Issue date Jun 4, 2002
- United Microelectronics Corp.
- Le-Tien Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing mask read-only memory cell
- Patent number 6,392,930
- Issue date May 21, 2002
- United Microelectronics Corp.
- Le-Tien Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing mask read-only memory cell
- Patent number 6,327,174
- Issue date Dec 4, 2001
- United Microelectronics Corp.
- Le-Tien Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for repairing failed memory cell by...
- Patent number 6,285,620
- Issue date Sep 4, 2001
- United Microelectronics Corp.
- Ming-Jing Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method for repairing failed memory cell by...
- Patent number 6,256,237
- Issue date Jul 3, 2001
- United Microelectronics Corp.
- Ming-Jing Ho
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20200035782
- Publication date Jan 30, 2020
- UNITED MICROELECTRONICS CORP.
- Li-Wei Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING THYRISTOR AND METAL-OXIDE SEMICONDUCTOR...
- Publication number 20190043863
- Publication date Feb 7, 2019
- UNITED MICROELECTRONICS CORP.
- Yukihiro Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING THYRISTOR AND METAL-OXIDE SEMICONDUCTOR...
- Publication number 20190035789
- Publication date Jan 31, 2019
- UNITED MICROELECTRONICS CORP.
- Yukihiro Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20180277545
- Publication date Sep 27, 2018
- UNITED MICROELECTRONICS CORP.
- Yukihiro Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING FLASH MEMORY CELL
- Publication number 20140106526
- Publication date Apr 17, 2014
- Taiwan Memory Company
- Yung-Chang Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD FOR A BURIED CIRCUIT STRUCTURE
- Publication number 20120196436
- Publication date Aug 2, 2012
- Le-Tien Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD FOR A BURIED CIRCUIT STRUCTURE
- Publication number 20120015515
- Publication date Jan 19, 2012
- Tai-Sheng Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING FLASH MEMORY CELL
- Publication number 20110244640
- Publication date Oct 6, 2011
- Yung-Chang Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BURIED BIT LINE PROCESS AND SCHEME
- Publication number 20110101435
- Publication date May 5, 2011
- TAIWAN MEMORY CORPORATION
- Le-Tien JUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING STORAGE NODE WITH SUPPORTED STRUCTURE OF STAC...
- Publication number 20100047992
- Publication date Feb 25, 2010
- Shih-Fan Kuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING SILICIDE
- Publication number 20060240666
- Publication date Oct 26, 2006
- Chao-Ching Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test key structure
- Publication number 20060192200
- Publication date Aug 31, 2006
- Chuck Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for forming a polycide gate and structure of the same
- Publication number 20050156252
- Publication date Jul 21, 2005
- United Microelectronics Corp.
- Yung-Chang Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for forming a polycide gate and structure of the same
- Publication number 20040166687
- Publication date Aug 26, 2004
- Yung-Chang Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for preventing polycide gate spiking
- Publication number 20020102817
- Publication date Aug 1, 2002
- Ming-Tsung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating embedded dynamic random access memory
- Publication number 20020061610
- Publication date May 23, 2002
- Ling-Yuk Tsang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing mask read-only memory cell
- Publication number 20010013599
- Publication date Aug 16, 2001
- Le-Tein Jung
- H01 - BASIC ELECTRIC ELEMENTS

Le-Tien Jung

Person

Patents Grantslast 30 patents

Semiconductor device having thyristor and metal-oxide semiconductor...

Semiconductor device having thyristor and metal-oxide semiconductor...

Method of integrating thyristor and metal-oxide semiconductor trans...

Semiconductor device and manufacturing method thereof

Method of manufacturing flash memory cell

Buried bit line process and scheme

Method of manufacturing flash memory cell

Manufacturing method for a buried circuit structure

Manufacturing method for a buried circuit structure

Method of fabricating storage node with supported structure of stac...

Test key structure

Method for preventing polycide gate spiking

Method for forming a triple well structure

Method of manufacturing mask read-only memory cell

Method of manufacturing mask read-only memory cell

Semiconductor device and method for repairing failed memory cell by...

Semiconductor device and method for repairing failed memory cell by...

Patents Applicationslast 30 patents

SEMICONDUCTOR STRUCTURE

SEMICONDUCTOR DEVICE HAVING THYRISTOR AND METAL-OXIDE SEMICONDUCTOR...

SEMICONDUCTOR DEVICE HAVING THYRISTOR AND METAL-OXIDE SEMICONDUCTOR...

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

METHOD OF MANUFACTURING FLASH MEMORY CELL

MANUFACTURING METHOD FOR A BURIED CIRCUIT STRUCTURE

MANUFACTURING METHOD FOR A BURIED CIRCUIT STRUCTURE

METHOD OF MANUFACTURING FLASH MEMORY CELL

BURIED BIT LINE PROCESS AND SCHEME

METHOD OF FABRICATING STORAGE NODE WITH SUPPORTED STRUCTURE OF STAC...

METHOD OF FORMING SILICIDE

Test key structure

Method for forming a polycide gate and structure of the same

Method for forming a polycide gate and structure of the same

Method for preventing polycide gate spiking

Method for fabricating embedded dynamic random access memory

Method of manufacturing mask read-only memory cell