Le Wang

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Wuhan, CN

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for semiconductor chip hole geometry metrology
- Patent number 11,674,909
- Issue date Jun 13, 2023
- Yangtze Memory Technologies Co., Ltd.
- Le Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for semiconductor chip hole geometry metrology
- Patent number 11,041,814
- Issue date Jun 22, 2021
- Yangtze Memory Technologies Co., Ltd.
- Le Wang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP HOLE GEOMETRY METROLOGY
- Publication number 20210293727
- Publication date Sep 23, 2021
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Le Wang
- G01 - MEASURING TESTING