Leah M. Pastel

Person

Ossining, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Lateral silicon-on-insulator bipolar junction transistor process an...
- Patent number 9,397,203
- Issue date Jul 19, 2016
- GLOBALFOUNDRIES Inc.
- John Z. Colt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data mining shape based data
- Patent number 9,244,946
- Issue date Jan 26, 2016
- International Business Machines Corporation
- Maroun Kassab
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data mining shape based data
- Patent number 9,235,601
- Issue date Jan 12, 2016
- International Business Machines Corporation
- Maroun Kassab
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lateral silicon-on-insulator bipolar junction transistor process an...
- Patent number 9,059,230
- Issue date Jun 16, 2015
- International Business Machines Corporation
- John Z. Colt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identifying defects
- Patent number 8,571,299
- Issue date Oct 29, 2013
- International Business Machines Corporation
- Mohammed F. Fayaz
- G01 - MEASURING TESTING
Information Patent Grant
Insertion of faults in logic model used in simulation
- Patent number 8,566,059
- Issue date Oct 22, 2013
- International Business Machines Corporation
- Rao H. Desineni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bit failure signature identification
- Patent number 8,451,018
- Issue date May 28, 2013
- International Business Machines Corporation
- Thomas D. Furland
- G01 - MEASURING TESTING
Information Patent Grant
Method of designing an integrated circuit based on a combination of...
- Patent number 8,347,260
- Issue date Jan 1, 2013
- International Business Machines Corporation
- Kerry Bernstein
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Random personalization of chips during fabrication
- Patent number 8,015,514
- Issue date Sep 6, 2011
- International Business Machines Corporation
- Mark D. Jaffe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for designing a product chip a priori for design subsetting...
- Patent number 7,895,545
- Issue date Feb 22, 2011
- International Business Machines Corporation
- John M. Cohn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Scan chain diagnostics using logic paths
- Patent number 7,895,487
- Issue date Feb 22, 2011
- International Business Machines Corporation
- Leendert M. Huisman
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for signature-based systematic condition detectio...
- Patent number 7,853,848
- Issue date Dec 14, 2010
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Grant
Integrated carbon nanotube sensors
- Patent number 7,484,423
- Issue date Feb 3, 2009
- International Business Machines Corporation
- Mark C. Hakey
- G01 - MEASURING TESTING
Information Patent Grant
Testing using independently controllable voltage islands
- Patent number 7,428,675
- Issue date Sep 23, 2008
- International Business Machines Corporation
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Sensor differentiated fault isolation
- Patent number 7,397,263
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Kevin L. Condon
- G01 - MEASURING TESTING
Information Patent Grant
Integrated carbon nanotube sensors
- Patent number 7,247,877
- Issue date Jul 24, 2007
- International Business Machines Corporation
- Mark C. Hakey
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain diagnostics using logic paths
- Patent number 7,240,261
- Issue date Jul 3, 2007
- International Business Machines Corporation
- Leendert M. Huisman
- G11 - INFORMATION STORAGE
Information Patent Grant
Utilizing clock shield as defect monitor
- Patent number 7,239,167
- Issue date Jul 3, 2007
- International Business Machines Corporation
- John M. Cohn
- G01 - MEASURING TESTING
Information Patent Grant
Inspection methods and structures for visualizing and/or detecting...
- Patent number 7,230,335
- Issue date Jun 12, 2007
- International Business Machines Corporation
- Jerome L. Cann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor differentiated fault isolation
- Patent number 7,202,689
- Issue date Apr 10, 2007
- International Business Machines Corporation
- Kevin L. Condon
- G01 - MEASURING TESTING
Information Patent Grant
Designing scan chains with specific parameter sensitivities to iden...
- Patent number 7,194,706
- Issue date Mar 20, 2007
- International Business Machines Corporation
- James W. Adkisson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Segmented scan chains with dynamic reconfigurations
- Patent number 7,139,950
- Issue date Nov 21, 2006
- International Business Machines Corporation
- Leendert M. Huisman
- G01 - MEASURING TESTING
Information Patent Grant
Method for designing an integrated circuit defect monitor
- Patent number 7,093,213
- Issue date Aug 15, 2006
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Canary device for failure analysis
- Patent number 7,089,138
- Issue date Aug 8, 2006
- International Business Machines Corporation
- Pierre J. Bouchard
- G01 - MEASURING TESTING
Information Patent Grant
Utilizing clock shield as defect monitor
- Patent number 7,088,124
- Issue date Aug 8, 2006
- International Business Machines Corporation
- John M. Cohn
- G01 - MEASURING TESTING
Information Patent Grant
Defect diagnosis for semiconductor integrated circuits
- Patent number 7,089,514
- Issue date Aug 8, 2006
- International Business Machines Corporation
- James W. Adkisson
- G01 - MEASURING TESTING
Information Patent Grant
Method for locating IDDQ defects using multiple controlled collapse...
- Patent number 7,064,570
- Issue date Jun 20, 2006
- International Business Machines, Corporation
- Patrick H. Buffet
- G01 - MEASURING TESTING
Information Patent Grant
Utilizing clock shield as defect monitor
- Patent number 7,005,874
- Issue date Feb 28, 2006
- International Business Machines Corporation
- John M. Cohn
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for monitoring defects
- Patent number 6,998,866
- Issue date Feb 14, 2006
- International Business Machines Corporation
- Greg Bazan
- G01 - MEASURING TESTING
Information Patent Grant
Internal cache for on chip test data storage
- Patent number 6,901,542
- Issue date May 31, 2005
- International Business Machines Corporation
- Thomas W. Bartenstein
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
LATERAL SILICON-ON-INSULATOR BIPOLAR JUNCTION TRANSISTOR PROCESS AN...
- Publication number 20150214346
- Publication date Jul 30, 2015
- International Business Machines Corporation
- John Z. Colt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA MINING SHAPE BASED DATA
- Publication number 20140149458
- Publication date May 29, 2014
- International Business Machines Corporation
- Maroun M. Kassab
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MINING SHAPE BASED DATA
- Publication number 20140149408
- Publication date May 29, 2014
- International Business Machines Corporation
- Maroun M. Kassab
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DESIGNING AN INTEGRATED CIRCUIT BASED ON A COMBINATION OF...
- Publication number 20120066657
- Publication date Mar 15, 2012
- International Business Machines Corporation
- Kerry Bernstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFYING DEFECTS
- Publication number 20120050728
- Publication date Mar 1, 2012
- International Business Machines Corporation
- Mohammed F. Fayaz
- G01 - MEASURING TESTING
Information Patent Application
BIT FAILURE SIGNATURE IDENTIFICATION
- Publication number 20110199114
- Publication date Aug 18, 2011
- International Business Machines Corporation
- Thomas D. Furland
- G01 - MEASURING TESTING
Information Patent Application
INSERTION OF FAULTS IN LOGIC MODEL USED IN SIMULATION
- Publication number 20110137602
- Publication date Jun 9, 2011
- International Business Machines Corporation
- Rao H. Desineni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RANDOM PERSONALIZATION OF CHIPS DURING FABRICATION
- Publication number 20100164013
- Publication date Jul 1, 2010
- International Business Machines Corporation
- Mark D. Jaffe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR DESIGNING A PRODUCT CHIP A PRIORI FOR DESIGN SUBSETTING...
- Publication number 20090259983
- Publication date Oct 15, 2009
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR SIGNATURE-BASED SYSTEMATIC CONDITION DETECTIO...
- Publication number 20090106614
- Publication date Apr 23, 2009
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Application
Testing Using Independently Controllable Voltage Islands
- Publication number 20080284459
- Publication date Nov 20, 2008
- International Business Machines Corporation
- Anne E. Gattiker
- G01 - MEASURING TESTING
Information Patent Application
Hot Switchable Voltage Bus for Iddq Current Measurements
- Publication number 20080129324
- Publication date Jun 5, 2008
- International Business Machines Corporation
- Leah M. P. Pastel
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CARBON NANOTUBE SENSORS
- Publication number 20070197010
- Publication date Aug 23, 2007
- Mark C. Hakey
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN DIAGNOSTICS USING LOGIC PATHS
- Publication number 20070168805
- Publication date Jul 19, 2007
- Leendert M. Huisman
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DIFFERENTIATED FAULT ISOLATION
- Publication number 20070126450
- Publication date Jun 7, 2007
- Kevin L. Condon
- G01 - MEASURING TESTING
Information Patent Application
UTILIZING CLOCK SHIELD AS DEFECT MONITOR
- Publication number 20070108964
- Publication date May 17, 2007
- John M. Cohn
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE ELECTRICALLY TESTABLE ACCELERATION AND VOLTAGE MEASUREMENT...
- Publication number 20070085156
- Publication date Apr 19, 2007
- International Business Machines Corporation
- Toshiharu Furukawa
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DIFFERENTIATED FAULT ISOLATION
- Publication number 20060232284
- Publication date Oct 19, 2006
- International Business Machines Corporation
- Kevin L. Condon
- G01 - MEASURING TESTING
Information Patent Application
CANARY DEVICE FOR FAILURE ANALYSIS
- Publication number 20060195285
- Publication date Aug 31, 2006
- International Business Machines Corporation
- Pierre J. Bouchard
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND STRUCTURE FOR DEFECT MONITORING OF SEMICONDUCTOR DEVICES...
- Publication number 20060170104
- Publication date Aug 3, 2006
- International Business Machines Corporation
- John M. Cohn
- G01 - MEASURING TESTING
Information Patent Application
Testing using independently controllable voltage islands
- Publication number 20060158222
- Publication date Jul 20, 2006
- Anne Gattiker
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHODS AND STRUCTURES FOR VISUALIZING AND/OR DETECTING...
- Publication number 20060071208
- Publication date Apr 6, 2006
- International Business Machines Corporation
- Jerome L. Cann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Utilizing clock shield as defect monitor
- Publication number 20060066342
- Publication date Mar 30, 2006
- John M. Cohn
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CARBON NANOTUBE SENSORS
- Publication number 20060038167
- Publication date Feb 23, 2006
- International Business Machines Corporation
- Mark C. Hakey
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DESIGNING AN INTEGRATED CIRCUIT DEFECT MONITOR
- Publication number 20060036976
- Publication date Feb 16, 2006
- International Business Machines Corporation
- John M. Cohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DIAGNOSIS FOR SEMICONDUCTOR INTEGRATED CIRCUITS
- Publication number 20060036975
- Publication date Feb 16, 2006
- International Business Machines Corporation
- James W. Adkisson
- G01 - MEASURING TESTING
Information Patent Application
Designing Scan Chains With Specific Parameter Sensitivities to Iden...
- Publication number 20060026472
- Publication date Feb 2, 2006
- International Business Machines Corporation
- James W. Adkisson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT AND METHOD FOR MONITORING DEFECTS
- Publication number 20060022693
- Publication date Feb 2, 2006
- International Business Machines Corporation
- Greg Bazan
- G01 - MEASURING TESTING
Information Patent Application
UTILIZING CLOCK SHIELD AS DEFECT MONITOR
- Publication number 20050285611
- Publication date Dec 29, 2005
- International Business Machines Corporation
- John M. Cohn
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND STRUCTURE FOR DEFECT MONITORING OF SEMICONDUCTOR DEVICES...
- Publication number 20050282297
- Publication date Dec 22, 2005
- International Business Machines Corporation
- John M. Cohn
- G01 - MEASURING TESTING

Leah M. Pastel

Person

Patents Grantslast 30 patents

Lateral silicon-on-insulator bipolar junction transistor process an...

Data mining shape based data

Data mining shape based data

Lateral silicon-on-insulator bipolar junction transistor process an...

Identifying defects

Insertion of faults in logic model used in simulation

Bit failure signature identification

Method of designing an integrated circuit based on a combination of...

Random personalization of chips during fabrication

Methods for designing a product chip a priori for design subsetting...

Scan chain diagnostics using logic paths

System and method for signature-based systematic condition detectio...

Integrated carbon nanotube sensors

Testing using independently controllable voltage islands

Sensor differentiated fault isolation

Integrated carbon nanotube sensors

Scan chain diagnostics using logic paths

Utilizing clock shield as defect monitor

Inspection methods and structures for visualizing and/or detecting...

Sensor differentiated fault isolation

Designing scan chains with specific parameter sensitivities to iden...

Segmented scan chains with dynamic reconfigurations

Method for designing an integrated circuit defect monitor

Canary device for failure analysis

Utilizing clock shield as defect monitor

Defect diagnosis for semiconductor integrated circuits

Method for locating IDDQ defects using multiple controlled collapse...

Utilizing clock shield as defect monitor

Circuit and method for monitoring defects

Internal cache for on chip test data storage

Patents Applicationslast 30 patents

LATERAL SILICON-ON-INSULATOR BIPOLAR JUNCTION TRANSISTOR PROCESS AN...

DATA MINING SHAPE BASED DATA

DATA MINING SHAPE BASED DATA

METHOD OF DESIGNING AN INTEGRATED CIRCUIT BASED ON A COMBINATION OF...

IDENTIFYING DEFECTS

BIT FAILURE SIGNATURE IDENTIFICATION

INSERTION OF FAULTS IN LOGIC MODEL USED IN SIMULATION

RANDOM PERSONALIZATION OF CHIPS DURING FABRICATION

METHODS FOR DESIGNING A PRODUCT CHIP A PRIORI FOR DESIGN SUBSETTING...

SYSTEM AND METHOD FOR SIGNATURE-BASED SYSTEMATIC CONDITION DETECTIO...

Testing Using Independently Controllable Voltage Islands

Hot Switchable Voltage Bus for Iddq Current Measurements

INTEGRATED CARBON NANOTUBE SENSORS

SCAN CHAIN DIAGNOSTICS USING LOGIC PATHS

SENSOR DIFFERENTIATED FAULT ISOLATION

UTILIZING CLOCK SHIELD AS DEFECT MONITOR

PASSIVE ELECTRICALLY TESTABLE ACCELERATION AND VOLTAGE MEASUREMENT...

SENSOR DIFFERENTIATED FAULT ISOLATION

CANARY DEVICE FOR FAILURE ANALYSIS

METHOD AND STRUCTURE FOR DEFECT MONITORING OF SEMICONDUCTOR DEVICES...

Testing using independently controllable voltage islands

INSPECTION METHODS AND STRUCTURES FOR VISUALIZING AND/OR DETECTING...

Utilizing clock shield as defect monitor

INTEGRATED CARBON NANOTUBE SENSORS

METHOD FOR DESIGNING AN INTEGRATED CIRCUIT DEFECT MONITOR

DEFECT DIAGNOSIS FOR SEMICONDUCTOR INTEGRATED CIRCUITS

Designing Scan Chains With Specific Parameter Sensitivities to Iden...

CIRCUIT AND METHOD FOR MONITORING DEFECTS

UTILIZING CLOCK SHIELD AS DEFECT MONITOR

METHOD AND STRUCTURE FOR DEFECT MONITORING OF SEMICONDUCTOR DEVICES...