Leah M. Pfeifer Pastel

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Essex, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining features associated with fails of integrated...
- Patent number 7,870,519
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Grant
Learning based logic diagnosis
- Patent number 7,558,999
- Issue date Jul 7, 2009
- International Business Machines Corporation
- James W. Adkisson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using clock gating or signal gating to partition a device for fault...
- Patent number 6,865,501
- Issue date Mar 8, 2005
- International Business Machines Corporation
- Leendert M. Huisman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING INTEGRATED CIRCUITS
- Publication number 20090240458
- Publication date Sep 24, 2009
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Application
USING CLOCK GATING OR SIGNAL GATING TO PARTITION A DEVICE FOR FAULT...
- Publication number 20080098268
- Publication date Apr 24, 2008
- IBM
- Leendert M. Huisman
- G01 - MEASURING TESTING
Information Patent Application
ITERATIVE PROCESS FOR IDENTIFYING SYSTEMATICS IN DATA
- Publication number 20070226566
- Publication date Sep 27, 2007
- Maroun Kassab
- G01 - MEASURING TESTING
Information Patent Application
LEARNING BASED LOGIC DIAGNOSIS
- Publication number 20050273656
- Publication date Dec 8, 2005
- International Business Machines Corporation
- James W. Adkisson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Using clock gating or signal gating to partition a device for fault...
- Publication number 20050108599
- Publication date May 19, 2005
- IBM
- Leendert M. Huisman
- G01 - MEASURING TESTING
Information Patent Application
Using clock gating or signal gating to partition a device for fault...
- Publication number 20030036869
- Publication date Feb 20, 2003
- International Business Machines Corporation
- Leendert M. Huisman
- G01 - MEASURING TESTING