Leah Marie Pfeifer Pastel

Person

Essex, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for testing integrated circuits
- Patent number 8,136,082
- Issue date Mar 13, 2012
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing integrated circuits
- Patent number 7,971,176
- Issue date Jun 28, 2011
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Grant
Passive electrically testable acceleration and voltage measurement...
- Patent number 7,898,045
- Issue date Mar 1, 2011
- International Business Machines Corporation
- Toshiharu Furukawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Passive electrically testable acceleration and voltage measurement...
- Patent number 7,629,192
- Issue date Dec 8, 2009
- International Business Machines Corporation
- Toshiharu Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure for defect monitoring of semiconductor devices...
- Patent number 7,285,860
- Issue date Oct 23, 2007
- International Business Machines Corporation
- John M. Cohn
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure for defect monitoring of semiconductor devices...
- Patent number 7,078,248
- Issue date Jul 18, 2006
- International Business Machines Corporation
- John M. Cohn
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosable scan chain
- Patent number 7,007,214
- Issue date Feb 28, 2006
- International Business Machines Corporation
- Steven Michael Eustis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING INTEGRATED CIRCUITS
- Publication number 20110214102
- Publication date Sep 1, 2011
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING AN INTEGRATED CIRCUIT AND ANALYZING TEST DATA
- Publication number 20090132976
- Publication date May 21, 2009
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE ELECTRICALLY TESTABLE ACCELERATION AND VOLTAGE MEASUREMENT...
- Publication number 20080258246
- Publication date Oct 23, 2008
- Toshiharu Furukawa
- G01 - MEASURING TESTING

Leah Marie Pfeifer Pastel

Person

Patents Grantslast 30 patents

Method for testing integrated circuits

Method for testing integrated circuits

Passive electrically testable acceleration and voltage measurement...

Passive electrically testable acceleration and voltage measurement...

Method and structure for defect monitoring of semiconductor devices...

Method and structure for defect monitoring of semiconductor devices...

Diagnosable scan chain

Patents Applicationslast 30 patents

METHOD FOR TESTING INTEGRATED CIRCUITS

METHOD FOR TESTING AN INTEGRATED CIRCUIT AND ANALYZING TEST DATA

PASSIVE ELECTRICALLY TESTABLE ACCELERATION AND VOLTAGE MEASUREMENT...