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Leah R. Soffer
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Cherry Hill, NJ, US
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Patents Grants
last 30 patents
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Patent Grant
Attitude determination system and method
Patent number
6,987,257
Issue date
Jan 17, 2006
Honeywell International Inc.
Mason A. Peck
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Attitude determination system and method
Publication number
20040144910
Publication date
Jul 29, 2004
Mason A. Peck
G01 - MEASURING TESTING