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Lee C. Kalem
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Los Gatos, CA, US
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Patents Grants
last 30 patents
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Patent Grant
System and method for interferometer non-linearity compensation
Patent number
7,436,519
Issue date
Oct 14, 2008
Agilent Technologies, Inc.
David C. Chu
G01 - MEASURING TESTING
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Patent Grant
Phase digitizer for signals in imperfect quadrature
Patent number
6,952,175
Issue date
Oct 4, 2005
Agilent Technologies, Inc.
David C. Chu
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
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Patent Application
System and method for interferometer non-linearity compensation
Publication number
20060274322
Publication date
Dec 7, 2006
David C. Chu
G01 - MEASURING TESTING
Information
Patent Application
Phase digitizer for signals in imperfect quadrature
Publication number
20050062624
Publication date
Mar 24, 2005
David C. Chu
H03 - BASIC ELECTRONIC CIRCUITRY