Lee D. Clementi

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Lake Wylie, SC, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for mapping surface topography of a substrate
- Patent number 6,621,581
- Issue date Sep 16, 2003
- ADE Corporation
- James David Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system for distinguishing pits and particles
- Patent number 6,509,965
- Issue date Jan 21, 2003
- ADE Optical Systems Corporation
- Michael E. Fossey
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for identifying the material of a particle oc...
- Patent number 6,122,047
- Issue date Sep 19, 2000
- ADE Optical Systems Corporation
- John C. Stover
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system for distinguishing pits and particles
- Patent number 6,118,525
- Issue date Sep 12, 2000
- ADE Optical Systems Corporation
- Michael E. Fossey
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection system and method of inspecting surface of workp...
- Patent number 5,712,701
- Issue date Jan 27, 1998
- ADE Optical Systems Corporation
- Lee D. Clementi
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection system with coincident detection
- Patent number 5,329,351
- Issue date Jul 12, 1994
- Estek Corporation
- Lee D. Clementi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer inspection system for distinguishing pits and particles
- Publication number 20040085533
- Publication date May 6, 2004
- ADE Optical Systems Corporation
- Michael E. Fossey
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system for distinguishing pits and particles
- Publication number 20030071992
- Publication date Apr 17, 2003
- ADE Optical Systems Corporation, a Massachusetts corporation
- Michael E. Fossey
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system for distinguishing pits and particles
- Publication number 20010048523
- Publication date Dec 6, 2001
- ADE Optical Systems Corporation, a Massachusetts corporation
- Michael E. Fossey
- G01 - MEASURING TESTING