Lee K. Galbraith

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Particle detection system employing a subsystem for collecting scat...
- Patent number 5,604,585
- Issue date Feb 18, 1997
- Tencor Instruments
- Ralph Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive spatial filter for surface inspection
- Patent number 5,276,498
- Issue date Jan 4, 1994
- Tencor Instruments
- Lee K. Galbraith
- G02 - OPTICS
Information Patent Grant
Flat field telecentric scanner
- Patent number 5,168,386
- Issue date Dec 1, 1992
- Tencor Instruments
- Lee K. Galbraith
- G02 - OPTICS
Information Patent Grant
Light collector for optical contaminant and flaw detector
- Patent number 4,601,576
- Issue date Jul 22, 1986
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING
Information Patent Grant
Dual collector optical flaw detector
- Patent number 4,597,665
- Issue date Jul 1, 1986
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for calibrating a surface scanner
- Patent number 4,512,659
- Issue date Apr 23, 1985
- Tencor Instruments
- Lee K. Galbraith
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning contaminant and defect detector
- Patent number 4,378,159
- Issue date Mar 29, 1983
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING
Information Patent Grant
Flash protection controller
- Patent number 4,282,429
- Issue date Aug 4, 1981
- The United States of America as represented by the United States Department o...
- Lee K. Galbraith
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
ANNULAR EFFERVESCENT NOZZLE
- Publication number 20230027176
- Publication date Jan 26, 2023
- Palo Alto Research Center Incorporated
- Kathryn F. Murphy
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...

Lee K. Galbraith

Person

Patents Grantslast 30 patents

Particle detection system employing a subsystem for collecting scat...

Adaptive spatial filter for surface inspection

Flat field telecentric scanner

Light collector for optical contaminant and flaw detector

Dual collector optical flaw detector

Apparatus for calibrating a surface scanner

Scanning contaminant and defect detector

Flash protection controller

Patents Applicationslast 30 patents

ANNULAR EFFERVESCENT NOZZLE