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Lee M. Klynn
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Los Altos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for determining the time and location of light...
Patent number
8,053,716
Issue date
Nov 8, 2011
Lockheed Martin Corporation
Munther M. Hindi
G01 - MEASURING TESTING
Information
Patent Grant
Gamma vector camera
Patent number
7,667,203
Issue date
Feb 23, 2010
Lockheed Martin Corporation
Munther M. Hindi
G01 - MEASURING TESTING
Information
Patent Grant
Neutron source detector
Patent number
7,667,206
Issue date
Feb 23, 2010
Lockheed Martin Corporation
Munther M. Hindi
G01 - MEASURING TESTING
Information
Patent Grant
System and method for capturing scintillation events
Patent number
7,465,938
Issue date
Dec 16, 2008
Lockheed Martin Corporation
Munther M. Hindi
G01 - MEASURING TESTING
Information
Patent Grant
Gamma vector camera
Patent number
7,274,020
Issue date
Sep 25, 2007
Lockheed Martin Corporation
Munther M. Hindi
G01 - MEASURING TESTING
Information
Patent Grant
Detection methods and system using sequenced technologies
Patent number
7,023,956
Issue date
Apr 4, 2006
Lockheed Martin Corporaiton
Michael A. Heaton
G01 - MEASURING TESTING
Information
Patent Grant
Digital radiographic weld inspection system
Patent number
6,137,860
Issue date
Oct 24, 2000
Lockheed Martin Corporation
John P. Ellegood
B24 - GRINDING POLISHING
Patents Applications
last 30 patents
Information
Patent Application
GAMMA VECTOR CAMERA
Publication number
20080210875
Publication date
Sep 4, 2008
Lockheed Martin Corporation
Munther M. HINDI
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHODS AND SYSTEM USING SEQUENCED TECHNOLOGIES
Publication number
20060008051
Publication date
Jan 12, 2006
Lockheed Martin Corporation
Michael A. Heaton
G01 - MEASURING TESTING