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Lee Ni Chung
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San Jose, CA, US
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last 30 patents
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Patent Grant
Configuration and testing of multiple-die integrated circuits
Patent number
9,091,727
Issue date
Jul 28, 2015
Xilinx, Inc.
Julian Lupu
G01 - MEASURING TESTING
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Patent Grant
Internal voltage level shifting for screening cold or hot temperatu...
Patent number
8,030,954
Issue date
Oct 4, 2011
Xilinx, Inc.
Srinivasa R. Parthasarathy
G01 - MEASURING TESTING
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Patent Grant
Built-in self test (BIST) technology for testing field programmable...
Patent number
7,302,625
Issue date
Nov 27, 2007
Xilinx, Inc.
Tassanee Payakapan
G06 - COMPUTING CALCULATING COUNTING