Lee Nino

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Raleigh, NC, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and test circuit for testing a dynamic memory circuit
- Patent number 6,862,234
- Issue date Mar 1, 2005
- Infineon Technologies AG
- Martin Versen
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method and test circuit for testing a dynamic memory circuit
- Publication number 20040257893
- Publication date Dec 23, 2004
- Martin Versen
- G11 - INFORMATION STORAGE