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Leela Ganguly
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Webster, NY, US
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last 30 patents
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Patent Grant
Method for additive adhesion force particle analysis and apparatus...
Patent number
6,598,466
Issue date
Jul 29, 2003
Xerox Corporation
Allen F. Deluca
G01 - MEASURING TESTING
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Patent Grant
Method for additive adhesion force particle analysis and apparatus...
Patent number
6,508,104
Issue date
Jan 21, 2003
Xerox Corporation
Allen F. Deluca
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for detecting substrate roughness and controll...
Patent number
5,689,757
Issue date
Nov 18, 1997
Xerox Corporation
John L. Ferrante
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY