Legardo Tardeo Reyes

Follow

Person

Pacifica, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for wafer-level testing of semiconductor lasers
- Patent number 6,448,805
- Issue date Sep 10, 2002
- Novalux, Inc.
- David Leslie Heald
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR WAFER-LEVEL TESTING OF SEMICONDUCTOR LASERS
- Publication number 20020109520
- Publication date Aug 15, 2002
- David Leslie Heald
- G01 - MEASURING TESTING