Lei Lin

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dynamic bit-scan techniques for memory device programming
- Patent number 10,971,222
- Issue date Apr 6, 2021
- SanDisk Technologies LLC
- Lei Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
State adaptive predictive programming
- Patent number 10,748,622
- Issue date Aug 18, 2020
- SanDisk Technologies LLC
- Lei Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-sensing scan for cross-temperature mitigation
- Patent number 10,636,488
- Issue date Apr 28, 2020
- Western Digital Technologies, Inc.
- Lei Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic bit-scan techniques for memory device programming
- Patent number 10,535,401
- Issue date Jan 14, 2020
- SanDisk Technologies LLC
- Lei Lin
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DYNAMICALLY ENABLING FOREGROUND SCANS OF MEMORY BLOCKS
- Publication number 20250130894
- Publication date Apr 24, 2025
- Micron Technology, Inc.
- Lei Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORD LINE BASED PROGRAM VOLTAGE ADJUSTMENT
- Publication number 20240420784
- Publication date Dec 19, 2024
- Micron Technology, Inc.
- Murong Lang
- G11 - INFORMATION STORAGE
Information Patent Application
NAND DETECT PROGRAM COMPLETION (NDPC) WITH POWER OFF CHARGE LOSS CA...
- Publication number 20240371450
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Peng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
MODIFICATION OF PROGRAM VOLTAGE LEVEL WITH READ OR PROGRAM-VERIFY A...
- Publication number 20240319886
- Publication date Sep 26, 2024
- Micron Technology, Inc.
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAM PULSE MODIFICATION
- Publication number 20240248612
- Publication date Jul 25, 2024
- Micron Technology, Inc.
- Lei Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER LOSS ERROR DETECTION USING PARTIAL BLOCK HANDLING
- Publication number 20240170090
- Publication date May 23, 2024
- Micron Technology, Inc.
- Peng ZHANG
- G11 - INFORMATION STORAGE
Information Patent Application
COUPLING CAPACITANCE REDUCTION DURING PROGRAM VERIFY FOR PERFORMANC...
- Publication number 20210383879
- Publication date Dec 9, 2021
- SANDISK TECHNOLOGIES LLC
- Lei Lin
- G11 - INFORMATION STORAGE
Information Patent Application
STATE ADAPTIVE PREDICTIVE PROGRAMMING
- Publication number 20200234768
- Publication date Jul 23, 2020
- SANDISK TECHNOLOGIES LLC
- Lei Lin
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC BIT-SCAN TECHNIQUES FOR MEMORY DEVICE PROGRAMMING
- Publication number 20200126613
- Publication date Apr 23, 2020
- SANDISK TECHNOLOGIES LLC
- Lei Lin
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-SENSING SCAN FOR CROSS-TEMPERATURE MITIGATION
- Publication number 20190371402
- Publication date Dec 5, 2019
- Western Digital Technologies, Inc.
- Lei Lin
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC BIT-SCAN TECHNIQUES FOR MEMORY DEVICE PROGRAMMING
- Publication number 20190371395
- Publication date Dec 5, 2019
- SANDISK TECHNOLOGIES LLC
- Lei Lin
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

Dynamic bit-scan techniques for memory device programming

State adaptive predictive programming

Multi-sensing scan for cross-temperature mitigation

Dynamic bit-scan techniques for memory device programming

Patents Applicationslast 30 patents

DYNAMICALLY ENABLING FOREGROUND SCANS OF MEMORY BLOCKS

WORD LINE BASED PROGRAM VOLTAGE ADJUSTMENT

NAND DETECT PROGRAM COMPLETION (NDPC) WITH POWER OFF CHARGE LOSS CA...

MODIFICATION OF PROGRAM VOLTAGE LEVEL WITH READ OR PROGRAM-VERIFY A...

PROGRAM PULSE MODIFICATION

POWER LOSS ERROR DETECTION USING PARTIAL BLOCK HANDLING

COUPLING CAPACITANCE REDUCTION DURING PROGRAM VERIFY FOR PERFORMANC...

STATE ADAPTIVE PREDICTIVE PROGRAMMING

DYNAMIC BIT-SCAN TECHNIQUES FOR MEMORY DEVICE PROGRAMMING

MULTI-SENSING SCAN FOR CROSS-TEMPERATURE MITIGATION

DYNAMIC BIT-SCAN TECHNIQUES FOR MEMORY DEVICE PROGRAMMING