LEI SHI

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Nantong, CN

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Patents Grantslast 30 patents

Information Patent Grant
Testing probe and semiconductor testing fixture, and fabrication me...
- Patent number 10,119,993
- Issue date Nov 6, 2018
- TONGFU MICROELECTRONICS CO., LTD.
- Lei Shi
- G01 - MEASURING TESTING
Information Patent Grant
Testing probe, semiconductor testing fixture and fabrication method...
- Patent number 10,067,162
- Issue date Sep 4, 2018
- TONGFU MICROELECTRONICS CO., LTD.
- Lei Shi
- G01 - MEASURING TESTING
Information Patent Grant
Testing probe and semiconductor testing fixture, and fabrication me...
- Patent number 10,006,939
- Issue date Jun 26, 2018
- TONGFU MICROELECTRONICS CO., LTD.
- Lei Shi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing fixture and fabrication method thereof
- Patent number 10,006,943
- Issue date Jun 26, 2018
- TONGFU MICROELECTRONICS CO., LTD.
- Lei Shi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing fixture and fabrication method thereof
- Patent number 10,001,509
- Issue date Jun 19, 2018
- TONGFU MICROELECTRONICS CO., LTD.
- Lei Shi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING PROBE, SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD...
- Publication number 20160124018
- Publication date May 5, 2016
- NANTONG FUJITSU MICROELECTRONICS CO., LTD.
- LEI SHI
- G01 - MEASURING TESTING
Information Patent Application
TESTING PROBE AND SEMICONDUCTOR TESTING FIXTURE, AND FABRICATION ME...
- Publication number 20160124016
- Publication date May 5, 2016
- NANTONG FUJITSU MICROELECTRONICS CO., LTD.
- LEI SHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF
- Publication number 20160124019
- Publication date May 5, 2016
- NANTONG FUJITSU MICROELECTRONICS CO., LTD.
- LEI SHI
- G01 - MEASURING TESTING
Information Patent Application
TESTING PROBE AND SEMICONDUCTOR TESTING FIXTURE, AND FABRICATION ME...
- Publication number 20160124017
- Publication date May 5, 2016
- NANTONG FUJITSU MICROELECTRONICS CO., LTD.
- LEI SHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF
- Publication number 20160124020
- Publication date May 5, 2016
- NANTONG FUJITSU MICROELECTRONICS CO., LTD.
- LEI SHI
- G01 - MEASURING TESTING