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Hefei, Anhui, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Method for diagnosing analog circuit fault based on vector-valued r...
Patent number
11,486,925
Issue date
Nov 1, 2022
HEFEI UNIVERSITY OF TECHNOLOGY
Yigang He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for diagnosing analog circuit fault based on cross wavelet f...
Patent number
11,409,933
Issue date
Aug 9, 2022
HEFEI UNIVERSITY OF TECHNOLOGY
Yigang He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Vector-valued regularized kernel function approximation based fault...
Patent number
11,287,470
Issue date
Mar 29, 2022
HEFEI UNIVERSITY OF TECHNOLOGY
Yigang He
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic interference objective complexity evaluation method...
Patent number
10,859,621
Issue date
Dec 8, 2020
WUHAN UNIVERSITY
Baiqiang Yin
G01 - MEASURING TESTING
Information
Patent Grant
Method for predicting remaining useful life of lithium battery base...
Patent number
10,408,882
Issue date
Sep 10, 2019
HEFEI UNIVERSITY OF TECHNOLOGY
Yigang He
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
VECTOR-VALUED REGULARIZED KERNEL FUNCTION APPROXIMATION BASED FAULT...
Publication number
20210293881
Publication date
Sep 23, 2021
HEFEI UNIVERSITY OF TECHNOLOGY
Yigang HE
G01 - MEASURING TESTING
Information
Patent Application
Method for diagnosing analog circuit fault based on cross wavelet f...
Publication number
20200394354
Publication date
Dec 17, 2020
HEFEI UNIVERSITY OF TECHNOLOGY
Yigang He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for diagnosing analog circuit fault based on vector-valued r...
Publication number
20200271720
Publication date
Aug 27, 2020
HEFEI UNIVERSITY OF TECHNOLOGY
Yigang He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTROMAGNETIC INTERFERENCE OBJECTIVE COMPLEXITY EVALUATION METHOD...
Publication number
20190285681
Publication date
Sep 19, 2019
WUHAN UNIVERSITY
Baiqiang YIN
G01 - MEASURING TESTING
Information
Patent Application
Method for predicting remaining useful life of lithium battery base...
Publication number
20170205466
Publication date
Jul 20, 2017
Yigang He
G01 - MEASURING TESTING
Information
Patent Application
Quantum evolution method
Publication number
20170116523
Publication date
Apr 27, 2017
HEFEI UNIVERSITY OF TECHNOLOGY
Yigang He
G06 - COMPUTING CALCULATING COUNTING