Leif X. Running

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Region overlap control for autorange/autoset functions
- Patent number 8,482,564
- Issue date Jul 9, 2013
- Tektronix, Inc.
- Craig H. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method and apparatus for signal analysis device
- Patent number 6,801,042
- Issue date Oct 5, 2004
- Tektronix, Inc.
- Mark E. Mc Pherson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REGION OVERLAP CONTROL FOR AUTORANGE/AUTOSET FUNCTIONS
- Publication number 20090109226
- Publication date Apr 30, 2009
- Tektronix, Inc.
- Craig H. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Indicia for Channels Collected Into a Group
- Publication number 20080191894
- Publication date Aug 14, 2008
- Tektronix, Inc.
- Evan A. Dickinson
- G01 - MEASURING TESTING
Information Patent Application
Calibration method and apparatus for signal analysis device
- Publication number 20030112017
- Publication date Jun 19, 2003
- Mark E. Mc Pherson
- G01 - MEASURING TESTING