Leland F. Rusk

Follow

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated test apparatus and method therefor
- Patent number 6,757,855
- Issue date Jun 29, 2004
- Advanced Micro Devices, Inc.
- Leland Freddie Rusk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methodology for testing and qualifying an integrated circuit by mea...
- Patent number 6,383,822
- Issue date May 7, 2002
- Advanced Micro Devices
- Michael W. Sprayberry
- G01 - MEASURING TESTING