LEO MENDELOVICI

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MEVASERET ZIYON, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining cleanliness of a sample
- Patent number 9,752,975
- Issue date Sep 5, 2017
- PERSYS TECHNOLOGY LTD.
- Leo Mendelovici
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining cleanliness of a sample
- Patent number 9,746,409
- Issue date Aug 29, 2017
- PERSYS TECHNOLOGY LTD.
- Yitzhak Vanek
- G01 - MEASURING TESTING
Information Patent Grant
Compact external torch assembly for semiconductor processing
- Patent number 6,179,609
- Issue date Jan 30, 2001
- Persys Technology Ltd.
- Gideon Drimer
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD TO ASSESS SUB-MICRON PARTICLE LEVELS OF A SAMPLE
- Publication number 20230184659
- Publication date Jun 15, 2023
- PERSYS TECHNOLOGIES LTD.
- Leo MENDELOVICI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING CLEANLINESS OF A SAMPLE
- Publication number 20160195467
- Publication date Jul 7, 2016
- PERSYS TECHNOLOGY LTD.
- LEO MENDELOVICI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING CLEANLINESS OF A SAMPLE
- Publication number 20160131567
- Publication date May 12, 2016
- PERSYS TECHNOLOGY LTD.
- YITZHAK VANEK
- G01 - MEASURING TESTING