Leon C. Vandervalk

Person

Brockville, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for testing surfaces for contaminants
- Patent number 10,514,328
- Issue date Dec 24, 2019
- DEFELKSO CORPORATION
- Leon Vandervalk
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for characterizing a replica tape
- Patent number 9,207,174
- Issue date Dec 8, 2015
- DeFelsko Corporation
- Leon Vandervalk
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic measuring gauge
- Patent number 9,188,672
- Issue date Nov 17, 2015
- DeFelsko Corporation
- Leon Vandervalk
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for characterizing a replica tape
- Patent number 8,994,933
- Issue date Mar 31, 2015
- DeFelsko Corporation
- Leon Vandervalk
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing using synthetic impulses
- Patent number 6,343,510
- Issue date Feb 5, 2002
- VN Instruments Limited
- Ian A. Neeson
- G01 - MEASURING TESTING
Information Patent Grant
High resolution ultrasonic thickness gauge
- Patent number 6,282,962
- Issue date Sep 4, 2001
- DeFelsko Corporation
- Frank J. Koch
- G01 - MEASURING TESTING
Information Patent Grant
High resolution ultrasonic thickness gauge
- Patent number 6,250,160
- Issue date Jun 26, 2001
- DeFelsko Corporation
- Frank J. Koch
- G01 - MEASURING TESTING
Information Patent Grant
Delay line for an ultrasonic probe and method of using same
- Patent number 6,122,968
- Issue date Sep 26, 2000
- DeFelsko Corporation
- Leon C. Vandervalk
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Delay line for an ultrasonic probe and method of using same
- Patent number 5,979,241
- Issue date Nov 9, 1999
- DeFelsko Corporation
- Leon C. Vandervalk
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Coating thickness gauge
- Patent number 5,930,744
- Issue date Jul 27, 1999
- DeFelsko Corporation
- Frank J. Koch
- G01 - MEASURING TESTING
Information Patent Grant
Delay line for an ultrasonic probe and method of using same
- Patent number 5,777,230
- Issue date Jul 7, 1998
- DeFelsko Corporation
- Leon C. Vandervalk
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Coating thickness gauge
- Patent number 5,751,608
- Issue date May 12, 1998
- DeFelsko Corporation
- Frank J. Koch
- G01 - MEASURING TESTING
Information Patent Grant
High resolution ultrasonic coating thickness gauge
- Patent number 5,723,791
- Issue date Mar 3, 1998
- DeFelsko Corporation
- Frank J. Koch
- G01 - MEASURING TESTING
Information Patent Grant
Combination coating thickness gauge using a magnetic flux density s...
- Patent number RE35703
- Issue date Dec 30, 1997
- DeFelsko Corporation
- Frank J. Koch
- 324 - Electricity: measuring and testing
Information Patent Grant
Gauge with reversible display screen
- Patent number 5,686,831
- Issue date Nov 11, 1997
- DeFelsko Corporation
- Leon C. Vandervalk
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Nondestructive anodic capacity gauge
- Patent number 5,623,427
- Issue date Apr 22, 1997
- DeFelsko Corporation
- Leon Vandervalk
- G01 - MEASURING TESTING
Information Patent Grant
Encryption apparatus for computer device
- Patent number 5,325,430
- Issue date Jun 28, 1994
- Toven Technologies Inc.
- Brian J. Smyth
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR TESTING SURFACES FOR CONTAMINANTS
- Publication number 20170261410
- Publication date Sep 14, 2017
- DEFELSKO CORPORATION
- Leon VANDERVALK
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CHARACTERIZING A REPLICA TAPE
- Publication number 20150233826
- Publication date Aug 20, 2015
- DEFELSKO CORPORATION
- Leon VANDERVALK
- G01 - MEASURING TESTING
Information Patent Application
PROBE COMMUNICATIONS MODULE AND A COMPUTING DEVICE
- Publication number 20140278257
- Publication date Sep 18, 2014
- DEFELSKO CORPORATION
- Leon Vandervalk
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CHARACTERIZING A REPLICA TAPE
- Publication number 20140192346
- Publication date Jul 10, 2014
- DEFELSKO CORPORATION
- Leon VANDERVALK
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC MEASURING GAUGE
- Publication number 20130272094
- Publication date Oct 17, 2013
- DEFELSKO CORPORATION
- Leon Vandervalk
- G01 - MEASURING TESTING

Leon C. Vandervalk

Person

Patents Grantslast 30 patents

Method and system for testing surfaces for contaminants

Apparatus and method for characterizing a replica tape

Ultrasonic measuring gauge

Apparatus and method for characterizing a replica tape

Ultrasonic testing using synthetic impulses

High resolution ultrasonic thickness gauge

High resolution ultrasonic thickness gauge

Delay line for an ultrasonic probe and method of using same

Delay line for an ultrasonic probe and method of using same

Coating thickness gauge

Delay line for an ultrasonic probe and method of using same

Coating thickness gauge

High resolution ultrasonic coating thickness gauge

Combination coating thickness gauge using a magnetic flux density s...

Gauge with reversible display screen

Nondestructive anodic capacity gauge

Encryption apparatus for computer device

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR TESTING SURFACES FOR CONTAMINANTS

APPARATUS AND METHOD FOR CHARACTERIZING A REPLICA TAPE

PROBE COMMUNICATIONS MODULE AND A COMPUTING DEVICE

APPARATUS AND METHOD FOR CHARACTERIZING A REPLICA TAPE

ULTRASONIC MEASURING GAUGE