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Leon Chen
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Optimization and scheduling of the handling of devices in the autom...
Patent number
11,156,659
Issue date
Oct 26, 2021
Advantest Corporation
Leon Chen
G01 - MEASURING TESTING
Information
Patent Grant
DUT testing with configurable cooling control using DUT internal te...
Patent number
10,677,842
Issue date
Jun 9, 2020
Advantest Corporation
Leon Chen
G01 - MEASURING TESTING
Information
Patent Grant
Test system supporting multiple users using different applications
Patent number
10,557,886
Issue date
Feb 11, 2020
Advantest Corporation
Rotem Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Test program flow control
Patent number
10,451,668
Issue date
Oct 22, 2019
Advantest Corporation
Rotem Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Implementing edit and update functionality within a development env...
Patent number
9,785,542
Issue date
Oct 10, 2017
Advantest Corporation
Mark Elston
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated generation of a test class pre-header from an interactive...
Patent number
9,785,526
Issue date
Oct 10, 2017
Advantest Corporation
Mark Elston
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Using shared pins in a concurrent test execution environment
Patent number
9,274,911
Issue date
Mar 1, 2016
Advantest Corporation
Mark Elston
G01 - MEASURING TESTING
Information
Patent Grant
Method and structure to develop a test program for semiconductor in...
Patent number
8,255,198
Issue date
Aug 28, 2012
Advantest Corporation
Ramachandran Krishnaswamy
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for performing installation and configuration man...
Patent number
8,082,541
Issue date
Dec 20, 2011
Advantest Corporation
Ankan Pramanick
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing integrated circuits
Patent number
7,437,261
Issue date
Oct 14, 2008
Advantest Corporation
Ankan Pramanick
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for simulating a modular test system
Patent number
7,210,087
Issue date
Apr 24, 2007
Advantest America R&D Center, Inc.
Conrad Mukai
G01 - MEASURING TESTING
Information
Patent Grant
Pattern data compression and decompression for semiconductor test s...
Patent number
5,883,906
Issue date
Mar 16, 1999
Advantest Corp.
James Alan Turnquist
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTIMIZATION AND SCHEDULING OF THE HANDLING OF DEVICES IN THE AUTOM...
Publication number
20200150178
Publication date
May 14, 2020
Advantest Corporation
Leon CHEN
G01 - MEASURING TESTING
Information
Patent Application
DUT TESTING WITH CONFIGURABLE COOLING CONTROL USING DUT INTERNAL TE...
Publication number
20180340974
Publication date
Nov 29, 2018
Advantest Corporation
Leon Chen
G01 - MEASURING TESTING
Information
Patent Application
TEST PROGRAM FLOW CONTROL
Publication number
20180313891
Publication date
Nov 1, 2018
Rotem Nahum
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM SUPPORTING MULTIPLE USERS USING DIFFERENT APPLICATIONS
Publication number
20180313892
Publication date
Nov 1, 2018
Rotem Nahum
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED GENERATION OF A TEST CLASS PRE-HEADER FROM AN INTERACTIVE...
Publication number
20140324378
Publication date
Oct 30, 2014
Advantest Corporation
Mark ELSTON
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMPLEMENTING EDIT AND UPDATE FUNCTIONALITY WITHIN A DEVELOPMENT ENV...
Publication number
20140310693
Publication date
Oct 16, 2014
Advantest Corporation
Mark ELSTON
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
USING SHARED PINS IN A CONCURRENT TEST EXECUTION ENVIRONMENT
Publication number
20140237291
Publication date
Aug 21, 2014
Advantest Corporation
Mark Elston
G01 - MEASURING TESTING
Information
Patent Application
Method and Structure to Develop a Test Program for Semiconductor In...
Publication number
20100192135
Publication date
Jul 29, 2010
Advantest Corporation
Ramachandran Krishnaswamy
G01 - MEASURING TESTING
Information
Patent Application
Method and system for performing installation and configuration man...
Publication number
20060130041
Publication date
Jun 15, 2006
Advantest Corporation
Ankan Pramanick
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and system for simulating a modular test system
Publication number
20050262412
Publication date
Nov 24, 2005
Advantest America R&D Center, Inc.
Conrad Mukai
G01 - MEASURING TESTING
Information
Patent Application
Method and structure to develop a test program for semiconductor in...
Publication number
20040225459
Publication date
Nov 11, 2004
Advantest Corporation
Ramachandran Krishnaswamy
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for testing integrated circuits
Publication number
20040225465
Publication date
Nov 11, 2004
Advantest Corporation
Ankan Pramanick
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor test system with time critical sequence generation us...
Publication number
20020157053
Publication date
Oct 24, 2002
Leon Lee Chen
G01 - MEASURING TESTING