Leon J. Kimball

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Montgomery, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of TEM sample preparation for electron holography for semico...
- Patent number 7,560,692
- Issue date Jul 14, 2009
- International Business Machines Corporation
- Keith E. Barton
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscopy sample preparation method for elec...
- Patent number 7,214,935
- Issue date May 8, 2007
- International Business Machines Corporation
- Thomas A. Bauer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF TEM SAMPLE PREPARATION FOR ELECTRON HOLOGRAPHY FOR SEMICO...
- Publication number 20080156987
- Publication date Jul 3, 2008
- International Business Machines Corporation
- Keith E. Barton
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPY SAMPLE PREPARATION METHOD FOR ELEC...
- Publication number 20060065830
- Publication date Mar 30, 2006
- International Business Machines Corporation
- Thomas A. Bauer
- G01 - MEASURING TESTING