Leon Van de Logt

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Son, NL

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Patents Grantslast 30 patents

Information Patent Grant
System and method for single terminal boundary scan
- Patent number 8,527,822
- Issue date Sep 3, 2013
- NXP B.V.
- Henk Boezen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR SINGLE TERMINAL BOUNDARY SCAN
- Publication number 20110093751
- Publication date Apr 21, 2011
- NXP B.V.
- Henk Boezen
- G01 - MEASURING TESTING
Information Patent Application
IC CIRCUIT WITH TEST ACCESS CONTROL CIRCUIT USING A JTAG INTERFACE
- Publication number 20090019328
- Publication date Jan 15, 2009
- Koninklijke Philips Electronics N.V.
- Leon Van De Logt
- G01 - MEASURING TESTING