Leonard Joseph Mahoney

Person

Allentown, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor array for measuring plasma characteristics in plasma process...
- Patent number 8,545,669
- Issue date Oct 1, 2013
- KLA-Tencor Corporation
- Leonard J. Mahoney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive controller for ion source
- Patent number 7,853,364
- Issue date Dec 14, 2010
- Veeco Instruments, Inc.
- James D. Deakins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer probe for measuring plasma and surface characteristics in pla...
- Patent number 7,192,505
- Issue date Mar 20, 2007
- Advanced Plasma, Inc.
- Gregory A. Roche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor array for measuring plasma characteristics in plasma process...
- Patent number 6,902,646
- Issue date Jun 7, 2005
- Advanced Energy Industries, Inc.
- Leonard J. Mahoney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer probe for measuring plasma and surface characteristics in pla...
- Patent number 6,830,650
- Issue date Dec 14, 2004
- Advanced Energy Industries, Inc.
- Gregory A. Roche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for deposition of diamond-like carbon and sili...
- Patent number 6,504,294
- Issue date Jan 7, 2003
- Morgan Chemical Products, Inc.
- Leonard Joseph Mahoney
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Inductively coupled ring-plasma source apparatus for processing gas...
- Patent number 6,432,260
- Issue date Aug 13, 2002
- Advanced Energy Industries, Inc.
- Leonard J. Mahoney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diamond-like carbon over-coats for optical recording media devices...
- Patent number 6,086,796
- Issue date Jul 11, 2000
- Diamonex, Incorporated
- David Ward Brown
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for deposition of diamond-like carbon and silicon-doped diam...
- Patent number 6,086,962
- Issue date Jul 11, 2000
- Diamonex, Incorporated
- Leonard Joseph Mahoney
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Gridless ion source for the vacuum processing of materials
- Patent number 5,973,447
- Issue date Oct 26, 1999
- Monsanto Company
- Leonard Joseph Mahoney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam process for deposition of highly wear-resistant optical co...
- Patent number 5,888,593
- Issue date Mar 30, 1999
- Monsanto Company
- Rudolph Hugo Petrmichl
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
ION BEAM DEPOSITION OF FLUORINE-BASED OPTICAL FILMS
- Publication number 20130122252
- Publication date May 16, 2013
- VEECO INSTRUMENTS, INC.
- Aiko Ode
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ADAPTIVE CONTROLLER FOR ION SOURCE
- Publication number 20080129209
- Publication date Jun 5, 2008
- Veeco Instruments, Inc.
- James D. Deakins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Application of in-situ plasma measurements to performance and contr...
- Publication number 20060180570
- Publication date Aug 17, 2006
- Leonard J. Mahoney
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Diagnostic plasma sensors for endpoint and end-of-life detection
- Publication number 20060171848
- Publication date Aug 3, 2006
- Advanced Energy Industries, Inc.
- Gregory A. Roche
- G01 - MEASURING TESTING
Information Patent Application
Electrically floating diagnostic plasma probe with ion property sen...
- Publication number 20060043063
- Publication date Mar 2, 2006
- Leonard J. Mahoney
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Diagnostic plasma measurement device having patterned sensors and f...
- Publication number 20050284570
- Publication date Dec 29, 2005
- Daniel B. Doran
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Techniques for packaging and encapsulating components of diagnostic...
- Publication number 20050217796
- Publication date Oct 6, 2005
- Daniel C. Carter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensor array for measuring plasma characteristics in plasma process...
- Publication number 20050151544
- Publication date Jul 14, 2005
- Advanced Energy Industries, Inc.
- Leonard J. Mahoney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer probe for measuring plasma and surface characteristics in pla...
- Publication number 20050039852
- Publication date Feb 24, 2005
- Advanced Energy Industries, Inc.
- Gregory A. Roche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensor array for measuring plasma characteristics in plasma process...
- Publication number 20050034811
- Publication date Feb 17, 2005
- Leonard J. Mahoney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer probe for measuring plasma and surface characteristics in pla...
- Publication number 20050034812
- Publication date Feb 17, 2005
- Gregory A. Roche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer probe for measuring plasma and surface characteristics in pla...
- Publication number 20050011611
- Publication date Jan 20, 2005
- Leonard J. Mahoney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer probe for measuring plasma and surface characteristics in pla...
- Publication number 20040007326
- Publication date Jan 15, 2004
- Gregory A. Roche
- H01 - BASIC ELECTRIC ELEMENTS

Leonard Joseph Mahoney

Person

Patents Grantslast 30 patents

Sensor array for measuring plasma characteristics in plasma process...

Adaptive controller for ion source

Wafer probe for measuring plasma and surface characteristics in pla...

Sensor array for measuring plasma characteristics in plasma process...

Wafer probe for measuring plasma and surface characteristics in pla...

Method and apparatus for deposition of diamond-like carbon and sili...

Inductively coupled ring-plasma source apparatus for processing gas...

Diamond-like carbon over-coats for optical recording media devices...

Method for deposition of diamond-like carbon and silicon-doped diam...

Gridless ion source for the vacuum processing of materials

Ion beam process for deposition of highly wear-resistant optical co...

Patents Applicationslast 30 patents

ION BEAM DEPOSITION OF FLUORINE-BASED OPTICAL FILMS

ADAPTIVE CONTROLLER FOR ION SOURCE

Application of in-situ plasma measurements to performance and contr...

Diagnostic plasma sensors for endpoint and end-of-life detection

Electrically floating diagnostic plasma probe with ion property sen...

Diagnostic plasma measurement device having patterned sensors and f...

Techniques for packaging and encapsulating components of diagnostic...

Sensor array for measuring plasma characteristics in plasma process...

Wafer probe for measuring plasma and surface characteristics in pla...

Sensor array for measuring plasma characteristics in plasma process...

Wafer probe for measuring plasma and surface characteristics in pla...

Wafer probe for measuring plasma and surface characteristics in pla...

Wafer probe for measuring plasma and surface characteristics in pla...