Leonard O. Farnsworth, III

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Lincoln, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Partial good integrated circuit and method of testing same
- Patent number 7,478,301
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Leonard O. Farnsworth, III
- G11 - INFORMATION STORAGE
Information Patent Grant
Partial good integrated circuit and method of testing same
- Patent number 7,434,129
- Issue date Oct 7, 2008
- International Business Machines Corporation
- Leonard O. Farnsworth, III
- G11 - INFORMATION STORAGE
Information Patent Grant
Partial good integrated circuit and method of testing same
- Patent number 7,305,600
- Issue date Dec 4, 2007
- International Business Machines Corporation
- Leonard O. Farnsworth, III
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for reducing test data volume in the testing of l...
- Patent number 7,103,816
- Issue date Sep 5, 2006
- Cadence Design Systems, Inc.
- Frank O. Distler
- G01 - MEASURING TESTING