Leonardo Gabriel MONTILLA

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Norwalk, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method, substrate and apparatus to measure performance of optical m...
- Patent number 11,016,396
- Issue date May 25, 2021
- ASML Holding N.V.
- Leonardo Gabriel Montilla
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
ASYMMETRY EXTENDED GRID MODEL FOR WAFER ALIGNMENT
- Publication number 20240168397
- Publication date May 23, 2024
- ASML NETHERLANDS B.V.
- Joshua ADAMS
- G01 - MEASURING TESTING
Information Patent Application
Method, Substrate and Apparatus to Measure Performance of Optical M...
- Publication number 20200073255
- Publication date Mar 5, 2020
- ASML Holding N.V.
- Leonardo Gabriel MONTILLA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY