Leonardus Leunissen

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Hamme-Mille, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting embedded voids in a semiconductor substrate
- Patent number 8,735,182
- Issue date May 27, 2014
- IMEC
- Leonardus Leunissen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for Detecting Embedded Voids in a Semiconductor Substrate
- Publication number 20120315712
- Publication date Dec 13, 2012
- IMEC
- Leonardus Leunissen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Preventing Galvanic Corrosion in Semicondu...
- Publication number 20090223832
- Publication date Sep 10, 2009
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Sylvain Garaud
- H01 - BASIC ELECTRIC ELEMENTS