Leonhard Heiss

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Warngau, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and a method for predicting a future state of an electron...
- Patent number 10,527,668
- Issue date Jan 7, 2020
- Intel IP Corporation
- Leonhard Heiss
- G01 - MEASURING TESTING
Information Patent Grant
Aging tolerant apparatus
- Patent number 10,128,248
- Issue date Nov 13, 2018
- Intel Corporation
- Karthik Ns
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR OVER-VOLTAGE PROTECTION
- Publication number 20200007120
- Publication date Jan 2, 2020
- Intel IP Corporation
- Dharmarayi Nedalgi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND A METHOD FOR PREDICTING A FUTURE STATE OF AN ELECTRON...
- Publication number 20180231601
- Publication date Aug 16, 2018
- Intel IP Corporation
- Leonhard Heiss
- H03 - BASIC ELECTRONIC CIRCUITRY