Leonid A. Vasilyev

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for characterizing photovoltaic cell and module...
- Patent number 9,537,444
- Issue date Jan 3, 2017
- Tau Science Corporation
- John M. Schmidt
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
High speed quantum efficiency measurement apparatus utilizing solid...
- Patent number 8,299,416
- Issue date Oct 30, 2012
- Tau Science Corporation
- Mark A. Arbore
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
High speed detection of shunt defects in photovoltaic and optoelect...
- Patent number 8,278,937
- Issue date Oct 2, 2012
- Tau Science Corporation
- Leonid A. Vasilyev
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Step function determination of Auger peak intensity
- Patent number 6,635,869
- Issue date Oct 21, 2003
- FEI Company
- Dimitri Klyachko
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of film thickness by inelastic electron scattering
- Patent number 6,399,944
- Issue date Jun 4, 2002
- FEI Company
- Leonid A. Vasilyev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Characterizing Photovoltaic Cell and Module...
- Publication number 20150084664
- Publication date Mar 26, 2015
- John M. Schmidt
- G01 - MEASURING TESTING
Information Patent Application
High speed quantum efficiency measurement apparatus utilizing solid...
- Publication number 20100219327
- Publication date Sep 2, 2010
- Mark A. Arbore
- G01 - MEASURING TESTING
Information Patent Application
High speed detection of shunt defects in photovoltaic and optoelect...
- Publication number 20100201374
- Publication date Aug 12, 2010
- Leonid A. Vasilyev
- G01 - MEASURING TESTING
Information Patent Application
Method of operating a probe microscope
- Publication number 20050194534
- Publication date Sep 8, 2005
- Eric Kneedler
- G01 - MEASURING TESTING
Information Patent Application
Step function determination of auger peak intensity
- Publication number 20020145111
- Publication date Oct 10, 2002
- Dimitri Klyachko
- G01 - MEASURING TESTING