Leonid Gurov

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Rishon Le Zion, IL

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for detecting defects on an electronic assembly
- Patent number 11,852,684
- Issue date Dec 26, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for detecting defects on an electronic assembly
- Patent number 11,650,250
- Issue date May 16, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Misalignment indication decision system and method
- Patent number 8,838,408
- Issue date Sep 16, 2014
- Optimal Plus Ltd
- Reed Linde
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for parametric testing
- Patent number 8,781,773
- Issue date Jul 15, 2014
- Optimal Plus Ltd
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for parametric test time reduction
- Patent number 8,112,249
- Issue date Feb 7, 2012
- Optimaltest Ltd
- Leonid Gurov
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY
- Publication number 20230236245
- Publication date Jul 27, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY
- Publication number 20210041501
- Publication date Feb 11, 2021
- Optimal Plus Ltd.
- Leonid GUROV
- G01 - MEASURING TESTING
Information Patent Application
MISALIGNMENT INDICATION DECISION SYSTEM AND METHOD
- Publication number 20120123734
- Publication date May 17, 2012
- OptimalTest Ltd.
- Reed LINDE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR PARAMETRIC TESTING
- Publication number 20110251812
- Publication date Oct 13, 2011
- OptimalTest Ltd.
- Leonid GUROV
- G01 - MEASURING TESTING
Information Patent Application
System and Methods for Parametric Test Time Reduction
- Publication number 20100161276
- Publication date Jun 24, 2010
- OptimalTest Ltd.
- Leonid Gurov
- G01 - MEASURING TESTING