Leonid KARLINSKY

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Rehovot, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 12,183,066
- Issue date Dec 31, 2024
- Applied Materials Israel Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,348,001
- Issue date May 31, 2022
- APPLIED MATERIAL ISRAEL, LTD.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,205,119
- Issue date Dec 21, 2021
- Applied Materials Israel Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,010,665
- Issue date May 18, 2021
- APPLIED MATERIAL ISRAEL, LTD.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for patch based inspection
- Patent number 9,904,995
- Issue date Feb 27, 2018
- Applied Materials Israel, Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20220067523
- Publication date Mar 3, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...
- Publication number 20170364798
- Publication date Dec 21, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170357895
- Publication date Dec 14, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170177997
- Publication date Jun 22, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PATCH BASED INSPECTION
- Publication number 20170169554
- Publication date Jun 15, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING