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Leroy G. Puffer
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Vernon, CT, US
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last 30 patents
Information
Patent Grant
Optical profile sensor
Patent number
6,205,240
Issue date
Mar 20, 2001
United Technologies Corporation
Kenneth A. Pietrzak
G01 - MEASURING TESTING
Information
Patent Grant
Optical profile sensor
Patent number
6,175,415
Issue date
Jan 16, 2001
United Technologies Corporation
Kenneth A. Pietrzak
G01 - MEASURING TESTING
Information
Patent Grant
Wire surface monitor
Patent number
4,705,957
Issue date
Nov 10, 1987
United Technologies Corporation
Leroy G. Puffer
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring the surface of elongated objects
Patent number
4,563,095
Issue date
Jan 7, 1986
Essex Group, Inc.
LeRoy G. Puffer
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for monitoring the surface character of circul...
Patent number
4,358,202
Issue date
Nov 9, 1982
Essex Group, Inc.
Leroy G. Puffer
G01 - MEASURING TESTING