Leroy J. Everett

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Glen Ellyn, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Regionless multiple label scintillation counting
- Patent number 4,628,205
- Issue date Dec 9, 1986
- Packard Instrument Company, Inc.
- Gustav C. van Cauter
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of sample homogeneity in sci...
- Patent number 4,555,629
- Issue date Nov 26, 1985
- Packard Instrument Company, Inc.
- Leroy J. Everett
- G01 - MEASURING TESTING
Information Patent Grant
Liquid sample aspirating and/or dispensing system
- Patent number 4,199,013
- Issue date Apr 22, 1980
- Packard Instrument Company, Inc.
- Andrew R. Reich
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL