LEROY WINEMBERG

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Voltage monitor with a trmimming circuit and method therefore
- Patent number 10,218,339
- Issue date Feb 26, 2019
- NXP USA, INC.
- Jae Woong Jeong
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Power supply noise sensor
- Patent number 10,084,437
- Issue date Sep 25, 2018
- NXP USA, INC.
- Jifeng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for built-in self test of low dropout regulators
- Patent number 9,933,802
- Issue date Apr 3, 2018
- NXP USA, INC.
- Jae Woong Jeong
- G05 - CONTROLLING REGULATING
Information Patent Grant
Functional path failure monitor
- Patent number 9,222,971
- Issue date Dec 29, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Xiaoxiao Wang
- G01 - MEASURING TESTING
Information Patent Grant
Resolution programmable dynamic IR-drop sensor with peak IR-drop tr...
- Patent number 9,043,620
- Issue date May 26, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Xiaoxiao Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VOLTAGE MONITOR WITH A TRMIMMING CIRCUIT AND METHOD THEREFORE
- Publication number 20190036516
- Publication date Jan 31, 2019
- NXP USA, Inc.
- JAE WOONG JEONG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FUNCTIONAL PATH FAILURE MONITOR
- Publication number 20150121158
- Publication date Apr 30, 2015
- XIAOXIAO WANG
- G01 - MEASURING TESTING
Information Patent Application
RESOLUTION PROGRAMMABLE DYNAMIC IR-DROP SENSOR WITH PEAK IR-DROP TR...
- Publication number 20140281642
- Publication date Sep 18, 2014
- XIAOXIAO WANG
- G01 - MEASURING TESTING